Victor Seng Keong LIM

Follow

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Defect monitoring in semiconductor device fabrication
- Patent number 8,339,449
- Issue date Dec 25, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Barbara Fong Chin Lim
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection recipe definition
- Patent number 8,289,508
- Issue date Oct 16, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Victor Seng Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test chiplets for devices
- Patent number 8,178,368
- Issue date May 15, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Victor Seng Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E-beam inspection structure for leakage analysis
- Patent number 7,939,348
- Issue date May 10, 2011
- Chartered Semiconductor Manufacturing, Ltd.
- Victor Seng Keong Lim
- G01 - MEASURING TESTING
Information Patent Grant
Elevated bond-pad structure for high-density flip-clip packaging an...
- Patent number 7,323,406
- Issue date Jan 29, 2008
- Chartered Semiconductor Manufacturing Ltd.
- Victor Seng-Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended poly buffer STI scheme
- Patent number 7,060,573
- Issue date Jun 13, 2006
- Chartered Semiconductor Manufacturing Ltd.
- Victor Seng Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST CHIPLETS FOR DEVICES
- Publication number 20110114949
- Publication date May 19, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Victor Seng Keong LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION RECIPE DEFINITION
- Publication number 20110116085
- Publication date May 19, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Victor Seng Keong LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT MONITORING IN SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20110032348
- Publication date Feb 10, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Barbara Fong Chin LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
E-BEAM INSPECTION STRUCTURE FOR LEAKAGE ANALYSIS
- Publication number 20090057664
- Publication date Mar 5, 2009
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Victor Seng Keong LIM
- G01 - MEASURING TESTING