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Victor Vertoprakhov
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Novosibirsk, RU
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Patents Grants
last 30 patents
Information
Patent Grant
Loop height measurement of overlapping bond wires
Patent number
11,721,571
Issue date
Aug 8, 2023
EMAGE VISION PTE. LTD.
Soon Wei Wong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Peripheral inspection system and method
Patent number
9,824,432
Issue date
Nov 21, 2017
Microview Technologies Pte Ltd
Victor Vertoprakhov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Object inspection system
Patent number
9,140,545
Issue date
Sep 22, 2015
VisionXtreme Pte Ltd
Victor Vertoprakhov
G01 - MEASURING TESTING
Information
Patent Grant
Image resolution multiplier
Patent number
7,884,861
Issue date
Feb 8, 2011
Microview Technologies PTD Ltd.
Victor Vertoprakhov
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Rotating prism component inspection system
Patent number
7,684,610
Issue date
Mar 23, 2010
Microview Technologies Pte Ltd
Soon Wei Wong
G01 - MEASURING TESTING
Information
Patent Grant
Fastener inspection system and method
Patent number
7,679,758
Issue date
Mar 16, 2010
Microview Technologies Pte Ltd
Wong Su Wei
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Inspection lighting head system and method of operation
Patent number
7,292,331
Issue date
Nov 6, 2007
Microview Technologies Pte Ltd
Victor Vertoprakhov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LOOP HEIGHT MEASUREMENT OF OVERLAPPING BOND WIRES
Publication number
20220115253
Publication date
Apr 14, 2022
EMAGE EQUIPMENT PTE. LTD.
Soon Wei Wong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PERIPHERAL INSPECTION SYSTEM AND METHOD
Publication number
20140333760
Publication date
Nov 13, 2014
Victor Vertoprakhov
G01 - MEASURING TESTING
Information
Patent Application
Object Inspection System
Publication number
20100220185
Publication date
Sep 2, 2010
VisionXtreme Pte Ltd
Victor Vertoprakhov
G01 - MEASURING TESTING
Information
Patent Application
Rotating prism component inspection system
Publication number
20080152211
Publication date
Jun 26, 2008
Soon Wei Wong
G01 - MEASURING TESTING
Information
Patent Application
Inspecting lighting head system and method of operation
Publication number
20080079935
Publication date
Apr 3, 2008
Victor Vertoprakhov
G01 - MEASURING TESTING
Information
Patent Application
Peripheral inspection system and method
Publication number
20080013820
Publication date
Jan 17, 2008
Microview Technology Ptd Ltd
Victor Vertoprakhov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fastener inspection system and method
Publication number
20060244953
Publication date
Nov 2, 2006
Wong Soon Wei
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
Image resolution multiplier
Publication number
20060215234
Publication date
Sep 28, 2006
Victor Vertoprakhov
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Inspection lighting head system and method of operation
Publication number
20060209299
Publication date
Sep 21, 2006
Victor Vertoprakhov
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for optical analogue to digital and/or optical digital to...
Publication number
20030048495
Publication date
Mar 13, 2003
Victor Vertoprakhov
G01 - MEASURING TESTING