Victoria Jean Bruce

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D imaging with multiple irradiation frequencies
- Patent number 9,354,185
- Issue date May 31, 2016
- Advanced Micro Devices, Inc.
- Farid Barakat
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional tomography
- Patent number 7,088,852
- Issue date Aug 8, 2006
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Resistivity analysis
- Patent number 7,062,399
- Issue date Jun 13, 2006
- Advance Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Indirect stimulation of an integrated circuit die
- Patent number 6,870,379
- Issue date Mar 22, 2005
- Advanced Micro Devices, Inc.
- Brennan V. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic semiconductor analysis arrangement and method therefor
- Patent number 6,844,928
- Issue date Jan 18, 2005
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
De broglie microscope
- Patent number 6,714,294
- Issue date Mar 30, 2004
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,700,659
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- Srikar V. Chunduri
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,635,839
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
Laser intrusive technique for locating specific integrated circuit...
- Patent number 6,617,862
- Issue date Sep 9, 2003
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing functional failures in integrate...
- Patent number 6,549,022
- Issue date Apr 15, 2003
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Trench-filled probe point for a semiconductor device
- Patent number 6,545,490
- Issue date Apr 8, 2003
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device test apparatus and method therefor
- Patent number 6,546,513
- Issue date Apr 8, 2003
- Advanced Micro Devices
- Richard Jacob Wilcox
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quadrant avalanche photodiode time-resolved detection
- Patent number 6,483,327
- Issue date Nov 19, 2002
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device navigation using laser scribing
- Patent number 6,417,068
- Issue date Jul 9, 2002
- Advance Micro Devices, Inc.
- Victoria Bruce
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Internal anti-reflective coating for interference reduction
- Patent number 6,410,349
- Issue date Jun 25, 2002
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Method for laser scanning flip-chip integrated circuits
- Patent number 6,375,347
- Issue date Apr 23, 2002
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Inducement and detection of latch-up using a laser scanning microscope
- Patent number 6,350,982
- Issue date Feb 26, 2002
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Navigation using 3-D detectable pattern
- Patent number 6,348,364
- Issue date Feb 19, 2002
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure with a backside protective layer and backsi...
- Patent number 6,300,148
- Issue date Oct 9, 2001
- Advanced Micro Devices
- Jeffrey David Birdsley
- G01 - MEASURING TESTING
Information Patent Grant
Endpoint detection for thinning of silicon of a flip chip bonded in...
- Patent number 6,285,036
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Method for etching a flip chip using secondary particle emissions t...
- Patent number 6,210,981
- Issue date Apr 3, 2001
- Advanced Micro Devices, Inc.
- Jeffrey David Birdsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for laser scanning flip-chip integrated circuits
- Patent number 6,146,014
- Issue date Nov 14, 2000
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing an electronic circuit formed upon a frontside surface of...
- Patent number 6,107,107
- Issue date Aug 22, 2000
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Endpoint detection for thinning of silicon of a flip chip bonded in...
- Patent number 6,069,366
- Issue date May 30, 2000
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Energy resolved emission microscopy system and method
- Patent number 5,661,520
- Issue date Aug 26, 1997
- Victoria Jean Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Emission microscope
- Patent number 5,301,006
- Issue date Apr 5, 1994
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
3D IMAGING WITH MULTIPLE IRRADIATION FREQUENCIES
- Publication number 20140177792
- Publication date Jun 26, 2014
- Advanced Micro Devices, Inc.
- Farid Barakat
- G01 - MEASURING TESTING

Victoria Jean Bruce

Person

Patents Grantslast 30 patents

3D imaging with multiple irradiation frequencies

Three-dimensional tomography

Resistivity analysis

Indirect stimulation of an integrated circuit die

Fiber optic semiconductor analysis arrangement and method therefor

De broglie microscope

Semiconductor analysis arrangement and method therefor

Semiconductor analysis arrangement and method therefor

Laser intrusive technique for locating specific integrated circuit...

Apparatus and method for analyzing functional failures in integrate...

Trench-filled probe point for a semiconductor device

Data processing device test apparatus and method therefor

Quadrant avalanche photodiode time-resolved detection

Semiconductor device navigation using laser scribing

Internal anti-reflective coating for interference reduction

Method for laser scanning flip-chip integrated circuits

Inducement and detection of latch-up using a laser scanning microscope

Navigation using 3-D detectable pattern

Semiconductor structure with a backside protective layer and backsi...

Endpoint detection for thinning of silicon of a flip chip bonded in...

Method for etching a flip chip using secondary particle emissions t...

Method for laser scanning flip-chip integrated circuits

Analyzing an electronic circuit formed upon a frontside surface of...

Endpoint detection for thinning of silicon of a flip chip bonded in...

Energy resolved emission microscopy system and method

Emission microscope

Patents Applicationslast 30 patents

3D IMAGING WITH MULTIPLE IRRADIATION FREQUENCIES