Vidyasagar Anantha

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Hyderabad, IN

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection recipe setup
- Patent number 9,714,905
- Issue date Jul 25, 2017
- KLA-Tencor Corp.
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic binning for diversification and defect discovery
- Patent number 9,582,869
- Issue date Feb 28, 2017
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unbiased wafer defect samples
- Patent number 8,948,494
- Issue date Feb 3, 2015
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Dynamic Care Area Generation on an Inspection...
- Publication number 20160377561
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Vijayakumar Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Binning for Diversification and Defect Discovery
- Publication number 20160110857
- Publication date Apr 21, 2016
- KLA-Tencor Corporation
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Application
Unbiased Wafer Defect Samples
- Publication number 20140133737
- Publication date May 15, 2014
- KLA-Tencor Corporation
- Martin Plihal
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...