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Viet Hoang Nguyen
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Patents Grants
last 30 patents
Information
Patent Grant
PUF method using and circuit having an array of bipolar transistors
Patent number
10,132,858
Issue date
Nov 20, 2018
NXP B.V.
Tony Vanhoucke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic lateral flow test arrangement and method
Patent number
9,921,228
Issue date
Mar 20, 2018
NXP B.V.
Viet Nguyen
G01 - MEASURING TESTING
Information
Patent Grant
Analyte detection methods and devices
Patent number
9,606,115
Issue date
Mar 28, 2017
NXP B.V.
Viet Hoang Nguyen
G01 - MEASURING TESTING
Information
Patent Grant
Device with capacitive security shield
Patent number
9,390,295
Issue date
Jul 12, 2016
NXP B.V.
Franciscus Franciscus Widdershoven
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of characterising an LED device
Patent number
9,271,370
Issue date
Feb 23, 2016
NXP B.V.
Viet Hoang Nguyen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated circuit comprising a gas sensor
Patent number
9,263,500
Issue date
Feb 16, 2016
ams International AG
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Grant
Lighting system
Patent number
9,210,761
Issue date
Dec 8, 2015
NXP, B.V.
Axel Nackaerts
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electronic device incorporating a randomized interconnection layer...
Patent number
9,171,810
Issue date
Oct 27, 2015
NXP B.V.
Michael Antoine Armand in't Zandt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of detecting a LED failure, a controller therefor, a lightin...
Patent number
9,161,414
Issue date
Oct 13, 2015
NXP, B.V.
Pascal Brancken
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor device having Au—Cu electrodes, and method of manufac...
Patent number
8,994,194
Issue date
Mar 31, 2015
NXP, B.V.
David van Steenwinckel
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive sensor, integrated circuit, electronic device and method
Patent number
8,779,781
Issue date
Jul 15, 2014
NXP, B.V.
Viet Hoang Nguyen
G01 - MEASURING TESTING
Information
Patent Grant
Exterior vehicle lights
Patent number
8,749,142
Issue date
Jun 10, 2014
NXP B.V.
Viet Hoang Nguyen
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor device having Au-Cu electrodes, and method of manufac...
Patent number
8,679,966
Issue date
Mar 25, 2014
NXP, B.V.
David Van Steenwinckel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYTE DETECTION METHODS AND DEVICES
Publication number
20150226736
Publication date
Aug 13, 2015
NXP B.V.
Viet Hoang Nguyen
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE INCORPORATING A RANDOMIZED INTERCONNECTION LAYER
Publication number
20150137380
Publication date
May 21, 2015
NXP B.V.
Michael Antoine Armand in 't Zandt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PUF METHOD USING AND CIRCUIT HAVING AN ARRAY OF BIPOLAR TRANSISTORS
Publication number
20150028847
Publication date
Jan 29, 2015
NXP B.V.
Tony Vanhoucke
G01 - MEASURING TESTING
Information
Patent Application
DEVICE WITH CAPACITIVE SECURITY SHIELD
Publication number
20150007353
Publication date
Jan 1, 2015
NXP B.V.
Franciscus Franciscus Widdershoven
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRONIC LATERAL FLOW TEST ARRANGEMENT AND METHOD
Publication number
20140323350
Publication date
Oct 30, 2014
NXP B.V.
Viet Nguyen
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING AU-CU ELECTRODES, AND METHOD OF MANUFAC...
Publication number
20140159173
Publication date
Jun 12, 2014
NXP B.V.
David van Steenwinckel
G01 - MEASURING TESTING
Information
Patent Application
BIOSENSOR MODULE COMPRISING A BIOCOMPATIBLE ELECTRODE
Publication number
20140151221
Publication date
Jun 5, 2014
NXP B.V.
Roel Daamen
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING A LED FAILURE, A CONTROLLER THEREFOR, A LIGHTIN...
Publication number
20140097849
Publication date
Apr 10, 2014
NXP B.V.
Pascal Brancken
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT COMPRISING A GAS SENSOR
Publication number
20130256825
Publication date
Oct 3, 2013
NXP B.V.
Aurelie HUMBERT
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING AU-CU ELECTRODES, AND METHOD OF MANUFAC...
Publication number
20130207206
Publication date
Aug 15, 2013
NXP B.V.
David VAN STEENWINCKEL
G01 - MEASURING TESTING
Information
Patent Application
Lighting System
Publication number
20130057157
Publication date
Mar 7, 2013
NXP B.V.
Axel Nackaerts
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF CHARACTERISING AN LED DEVICE
Publication number
20120290241
Publication date
Nov 15, 2012
NXP B.V.
Viet Hoang Nguyen
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD
Publication number
20120256645
Publication date
Oct 11, 2012
NXP B.V.
Viet Hoang Nguyen
G01 - MEASURING TESTING
Information
Patent Application
EXTERIOR VEHICLE LIGHTS
Publication number
20120086335
Publication date
Apr 12, 2012
NXP B.V.
Viet Hoang Nguyen
B60 - VEHICLES IN GENERAL