Vijay K. Vuppaladadium

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Folsom, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to utilize a digital-time-conversion (DTC) bas...
- Patent number 11,327,523
- Issue date May 10, 2022
- Intel Corporation
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to utilize a digital-time-conversion (DTC) bas...
- Patent number 10,571,953
- Issue date Feb 25, 2020
- Intel Corporation
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for controlled reset sequences without paralle...
- Patent number 9,223,365
- Issue date Dec 29, 2015
- Intel Corporation
- Ivan Herrera Mejia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing an integrated device's input/outpu...
- Patent number 7,496,803
- Issue date Feb 24, 2009
- Intel Corporation
- Tanveer R. Khondker
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for alignment of signals in integrated circuits
- Patent number 6,891,417
- Issue date May 10, 2005
- Intel Corporation
- Tanveer R Khondker
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS TO UTILIZE A DIGITAL-TIME-CONVERSION (DTC) BAS...
- Publication number 20200301465
- Publication date Sep 24, 2020
- Intel Corporation
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO UTILIZE A DIGITAL-TIME-CONVERSION (DTC) BAS...
- Publication number 20190011945
- Publication date Jan 10, 2019
- Intel Corporation
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLED RESET SEQUENCES WITHOUT PARALLE...
- Publication number 20140281641
- Publication date Sep 18, 2014
- Intel Corporation
- Ivan Herrera Mejia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for testing an integrated device's input/outpu...
- Publication number 20070067686
- Publication date Mar 22, 2007
- Tanveer R. Khondker
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS FOR ALIGNMENT OF SIGNALS IN INTEGRATED CIRCUITS
- Publication number 20050001664
- Publication date Jan 6, 2005
- Intel Corporation
- Tanveer R. Khondker
- H03 - BASIC ELECTRONIC CIRCUITRY