Viktor Koldiaev

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,988,611
- Issue date May 21, 2024
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,199,507
- Issue date Dec 14, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,150,287
- Issue date Oct 19, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,092,637
- Issue date Aug 17, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 10,663,504
- Issue date May 26, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 10,613,131
- Issue date Apr 7, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 10,591,525
- Issue date Mar 17, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 10,551,325
- Issue date Feb 4, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Vertical super-thin body semiconductor on dielectric wall devices a...
- Patent number 9,520,501
- Issue date Dec 13, 2016
- Finscale Inc.
- Viktor I. Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for providing a semiconductor memory device
- Patent number 9,331,083
- Issue date May 3, 2016
- Micron Technology, Inc.
- Serguei Okhonin
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for providing a semiconductor memory device
- Patent number 9,093,311
- Issue date Jul 28, 2015
- Micron Technology, Inc.
- Michael A. Van Buskirk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical super-thin body semiconductor on dielectric wall devices a...
- Patent number 9,093,304
- Issue date Jul 28, 2015
- Finscale Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for providing a semiconductor memory device
- Patent number 8,817,534
- Issue date Aug 26, 2014
- Micron Technology, Inc.
- Serguei Okhonin
- G11 - INFORMATION STORAGE
Information Patent Grant
Vertical super-thin body semiconductor on dielectric wall devices a...
- Patent number 8,796,085
- Issue date Aug 5, 2014
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 8,748,959
- Issue date Jun 10, 2014
- Micron Technology, Inc.
- Michael A. Van Buskirk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for providing a semiconductor memory device
- Patent number 8,537,610
- Issue date Sep 17, 2013
- Micron Technology, Inc.
- Serguei Okhonin
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having memory cells including gate material havi...
- Patent number 8,189,376
- Issue date May 29, 2012
- Micron Technology, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implantation of deuterium in MOS and DRAM devices
- Patent number 7,087,507
- Issue date Aug 8, 2006
- PDF Solutions, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20250093277
- Publication date Mar 20, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20220317060
- Publication date Oct 6, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20210055338
- Publication date Feb 25, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20200408699
- Publication date Dec 31, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20200400732
- Publication date Dec 24, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20200348348
- Publication date Nov 5, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180299497
- Publication date Oct 18, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20180292441
- Publication date Oct 11, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20180217193
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180217192
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL SUPER-THIN BODY SEMICONDUCTOR ON DIELECTRIC WALL DEVICES A...
- Publication number 20170186882
- Publication date Jun 29, 2017
- FinScale Inc.
- Viktor I. Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20160131594
- Publication date May 12, 2016
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20150331029
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20150330908
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHONOLOGIES
- Publication number 20150330909
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20150331036
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL SUPER-THIN BODY SEMICONDUCTOR ON DIELECTRIC WALL DEVICES A...
- Publication number 20150279997
- Publication date Oct 1, 2015
- FinScale Inc.
- Viktor I. Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140349450
- Publication date Nov 27, 2014
- Micron Technology, Inc.
- Serguei OKHONIN
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140291763
- Publication date Oct 2, 2014
- Micron Technology, Inc.
- Michael A. VAN BUSKIRK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical Super-Thin Body Semiconductor on Dielectric Wall Devices a...
- Publication number 20140106523
- Publication date Apr 17, 2014
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE
- Publication number 20130250699
- Publication date Sep 26, 2013
- Micron Technology, Inc.
- Serguei OKHONIN
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE
- Publication number 20110007578
- Publication date Jan 13, 2011
- Innovative Silicon Isi SA
- Serguei Okhonin
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE
- Publication number 20100259964
- Publication date Oct 14, 2010
- Innovative Silicon Isi SA
- Michael A. Van Buskirk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Having Memory Cells Including Gate Material Havi...
- Publication number 20090200612
- Publication date Aug 13, 2009
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Having Electrical Isolation Regions, Mask Techno...
- Publication number 20090200635
- Publication date Aug 13, 2009
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Implantation of deuterium in MOS and DRAM devices
- Publication number 20050255684
- Publication date Nov 17, 2005
- PDF Solutions, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Oxide-Nitride-Oxide spacer with oxide layers free of nitridization
- Publication number 20050040479
- Publication date Feb 24, 2005
- PDF Solutions
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS

Viktor Koldiaev

Person

Patents Grantslast 30 patents

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Pump and probe type second harmonic generation metrology

Field-biased second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Pump and probe type second harmonic generation metrology

Field-biased second harmonic generation metrology

Field-biased second harmonic generation metrology

Pump and probe type second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Vertical super-thin body semiconductor on dielectric wall devices a...

Techniques for providing a semiconductor memory device

Techniques for providing a semiconductor memory device

Vertical super-thin body semiconductor on dielectric wall devices a...

Techniques for providing a semiconductor memory device

Vertical super-thin body semiconductor on dielectric wall devices a...

Semiconductor memory device

Techniques for providing a semiconductor memory device

Integrated circuit having memory cells including gate material havi...

Implantation of deuterium in MOS and DRAM devices

Patents Applicationslast 30 patents

WAFER METROLOGY TECHNOLOGIES

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

WAFER METROLOGY TECHNOLOGIES

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

VERTICAL SUPER-THIN BODY SEMICONDUCTOR ON DIELECTRIC WALL DEVICES A...

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

WAFER METROLOGY TECHONOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

VERTICAL SUPER-THIN BODY SEMICONDUCTOR ON DIELECTRIC WALL DEVICES A...

TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE

TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE

Vertical Super-Thin Body Semiconductor on Dielectric Wall Devices a...

TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE

TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE

TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE

Integrated Circuit Having Memory Cells Including Gate Material Havi...

Integrated Circuit Having Electrical Isolation Regions, Mask Techno...

Implantation of deuterium in MOS and DRAM devices

Oxide-Nitride-Oxide spacer with oxide layers free of nitridization