Vince Ryo Butsumyo

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Simplified quality indicator bit test procedures
- Patent number 6,735,216
- Issue date May 11, 2004
- Qualcomm, Inc.
- Tao Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Simplified quality indicator bit test procedures
- Publication number 20020064133
- Publication date May 30, 2002
- Tao Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE