Vincent E. Lopopolo

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING