Vincent J. Coates

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for determining absolute reflectance of a material in the ul...
- Patent number RE34783
- Issue date Nov 8, 1994
- Nanometrics Incorporated
- Vincent J. Coates
- 250 - Radiant energy
Information Patent Grant
Method for determining absolute reflectance of a material in the ul...
- Patent number 5,045,704
- Issue date Sep 3, 1991
- Nanometrics Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Method for normalizing the detection signals of magnified images of...
- Patent number 4,884,890
- Issue date Dec 5, 1989
- Nanometrics Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurements of thin conductive films
- Patent number 4,849,694
- Issue date Jul 18, 1989
- Nanometrics, Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Thin dielectric film measuring system
- Patent number 4,826,321
- Issue date May 2, 1989
- Nanometrics, Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Secondary electron emission control in electron microscopes
- Patent number 4,743,757
- Issue date May 10, 1988
- Nanometrics Incorporated
- Vincent J. Coates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-stage secondary emission electron detection in electron micro...
- Patent number 4,596,929
- Issue date Jun 24, 1986
- Nanometrics Incorporated
- Vincent J. Coates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linewidth measuring with linearity calibration of the T.V. camera tube
- Patent number 4,521,686
- Issue date Jun 4, 1985
- Nanometrics Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Computerized micromeasuring system and method therefor
- Patent number 4,373,817
- Issue date Feb 15, 1983
- Nanometrics Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING
Information Patent Grant
Method for the precise determination of photoresist exposure time
- Patent number 4,308,586
- Issue date Dec 29, 1981
- Nanometrics, Incorporated
- Vincent J. Coates
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Vincent J. Coates

Person

Patents Grantslast 30 patents

Method for determining absolute reflectance of a material in the ul...

Method for determining absolute reflectance of a material in the ul...

Method for normalizing the detection signals of magnified images of...

Thickness measurements of thin conductive films

Thin dielectric film measuring system

Secondary electron emission control in electron microscopes

Three-stage secondary emission electron detection in electron micro...

Linewidth measuring with linearity calibration of the T.V. camera tube

Computerized micromeasuring system and method therefor

Method for the precise determination of photoresist exposure time