Vincent M. Donnelly

Person

Berkeley Heights, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Device having a high dielectric constant material and a method of m...
- Patent number 6,511,872
- Issue date Jan 28, 2003
- Agere Systems Inc.
- Vincent M. Donnelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilevel wiring structure and method of fabricating a multilevel...
- Patent number 6,143,658
- Issue date Nov 7, 2000
- Lucent Technologies Inc.
- Vincent Michael Donnelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device processing involving an optical interferometric thermometry
- Patent number 5,467,732
- Issue date Nov 21, 1995
- AT&T Corp.
- Vincent M. Donnelly
- G01 - MEASURING TESTING
Information Patent Grant
Device processing involving an optical interferometric thermometry...
- Patent number 5,229,303
- Issue date Jul 20, 1993
- AT&T Bell Laboratories
- Vincent M. Donnelly
- G01 - MEASURING TESTING
Information Patent Grant
Deposition of III-V semiconductor materials
- Patent number 4,645,687
- Issue date Feb 24, 1987
- AT&T Laboratories
- Vincent M. Donnelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching techniques
- Patent number 4,498,953
- Issue date Feb 12, 1985
- AT&T Bell Laboratories
- Joel M. Cook
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Crystallographic etching of III-V semiconductor materials
- Patent number 4,397,711
- Issue date Aug 9, 1983
- Bell Telephone Laboratories, Incorporated
- Vincent M. Donnelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopic monitoring of gas-solid processes
- Patent number 4,394,237
- Issue date Jul 19, 1983
- Bell Telephone Laboratories, Incorporated
- Vincent M. Donnelly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Plasma-assisted etch process with endpoint detection
- Patent number 4,377,436
- Issue date Mar 22, 1983
- Bell Telephone Laboratories, Incorporated
- Vincent M. Donnelly
- G01 - MEASURING TESTING
Information Patent Grant
Radiation induced deposition of metal on semiconductor surfaces
- Patent number 4,359,485
- Issue date Nov 16, 1982
- Bell Telephone Laboratories, Incorporated
- Vincent M. Donnelly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
DEVICE HAVING A HIGH DIELECTRIC CONSTANT MATERIAL AND A METHOD OF M...
- Publication number 20030013269
- Publication date Jan 16, 2003
- Vincent M. Donnelly
- H01 - BASIC ELECTRIC ELEMENTS

Vincent M. Donnelly

Person

Patents Grantslast 30 patents

Device having a high dielectric constant material and a method of m...

Multilevel wiring structure and method of fabricating a multilevel...

Device processing involving an optical interferometric thermometry

Device processing involving an optical interferometric thermometry...

Deposition of III-V semiconductor materials

Etching techniques

Crystallographic etching of III-V semiconductor materials

Spectroscopic monitoring of gas-solid processes

Plasma-assisted etch process with endpoint detection

Radiation induced deposition of metal on semiconductor surfaces

Patents Applicationslast 30 patents

DEVICE HAVING A HIGH DIELECTRIC CONSTANT MATERIAL AND A METHOD OF M...