Vincent Sebastian Immer

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Zikron Yaakov, IL

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Patents Grantslast 30 patents

Information Patent Grant
Expediting spectral measurement in semiconductor device fabrication
- Patent number 11,237,120
- Issue date Feb 1, 2022
- KLA-Tencor Corporation
- Vincent Immer
- G01 - MEASURING TESTING
Information Patent Grant
Expediting spectral measurement in semiconductor device fabrication
- Patent number 10,761,034
- Issue date Sep 1, 2020
- KLA-Tencor Corporation
- Vincent Immer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target location in semiconductor manufacturing
- Patent number 10,504,802
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Naomi Ittah
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping of a wafer
- Patent number 10,317,198
- Issue date Jun 11, 2019
- KLA-Tencor Corporation
- Vincent Sebastian Immer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Expediting Spectral Measurement in Semiconductor Device Fabrication
- Publication number 20200393373
- Publication date Dec 17, 2020
- KLA-Tencor Corporation
- Vincent Immer
- G01 - MEASURING TESTING
Information Patent Application
Expediting Spectral Measurement in Semiconductor Device Fabrication
- Publication number 20180372652
- Publication date Dec 27, 2018
- KLA-Tencor Corporation
- Vincent Immer
- G02 - OPTICS
Information Patent Application
Target Location in Semiconductor Manufacturing
- Publication number 20180301385
- Publication date Oct 18, 2018
- KLA-Tencor Corporation
- Naomi Ittah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Three-Dimensional Mapping of a Wafer
- Publication number 20180245910
- Publication date Aug 30, 2018
- KLA-Tencor Corporation
- Vincent Sebastian Immer
- G01 - MEASURING TESTING