Vincent Truffert

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Vorst, BE

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Patents Grantslast 30 patents

Information Patent Grant
Metrology method for a semiconductor manufacturing process
- Patent number 10,824,081
- Issue date Nov 3, 2020
- Imec VZW
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method for a semiconductor manufacturing process
- Patent number 10,656,535
- Issue date May 19, 2020
- Imec VZW
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for semiconductor manufacturing
- Patent number 10,481,504
- Issue date Nov 19, 2019
- Imec VZW
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for hotspot detection and ranking of a lithographic mask
- Patent number 9,874,821
- Issue date Jan 23, 2018
- Imec VZW
- Sandip Halder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Metrology Method for a Semiconductor Manufacturing Process
- Publication number 20200233317
- Publication date Jul 23, 2020
- IMEC vzw
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Semiconductor Manufacturing
- Publication number 20200050112
- Publication date Feb 13, 2020
- IMEC vzw
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Semiconductor Manufacturing
- Publication number 20190137881
- Publication date May 9, 2019
- IMEC vzw
- Christopher Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method for a Semiconductor Manufacturing Process
- Publication number 20180284624
- Publication date Oct 4, 2018
- IMEC vzw
- Christopher Ausschnitt
- G01 - MEASURING TESTING
Information Patent Application
Method for Hotspot Detection and Ranking of a Lithographic Mask
- Publication number 20160313647
- Publication date Oct 27, 2016
- IMEC vzw
- Sandip Halder
- G01 - MEASURING TESTING