Vineet Sreekumar

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Mumbai, IN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit characterization based on measured and static ap...
- Patent number 8,832,634
- Issue date Sep 9, 2014
- LSI Corporation
- Suharli Tedja
- G01 - MEASURING TESTING
Information Patent Grant
Scan test circuitry configured for bypassing selected segments of a...
- Patent number 8,726,108
- Issue date May 13, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT CHARACTERIZATION BASED ON MEASURED AND STATIC AP...
- Publication number 20140068532
- Publication date Mar 6, 2014
- LSI Corporation
- Suharli Tedja
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST CIRCUITRY CONFIGURED FOR BYPASSING SELECTED SEGMENTS OF A...
- Publication number 20130185607
- Publication date Jul 18, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING