Violeta Navarro Paredes

Person

  • Eindhoven, NL

Patents Grantslast 30 patents

  • Information Patent Grant

    Contamination trap

    • Patent number 11,982,947
    • Issue date May 14, 2024
    • ASML NETHERLAND B.V.
    • Sander Catharina Reinier Derks
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Contamination trap

    • Patent number 11,556,067
    • Issue date Jan 17, 2023
    • ASML Netherlands B.V.
    • Sander Catharina Reinier Derks
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Method, atomic force microscopy system and computer program product

    • Patent number 11,289,367
    • Issue date Mar 29, 2022
    • Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    • Violeta Navarro Paredes
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of and system for determining an overlay or alignment error...

    • Patent number 10,859,925
    • Issue date Dec 8, 2020
    • Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    • Violeta Navarro Paredes
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CONTAMINATION TRAP

    • Publication number 20230091648
    • Publication date Mar 23, 2023
    • ASML NETHERLANDS B.V.
    • Sander Catharina Reinier DERKS
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    CONTAMINATION TRAP

    • Publication number 20220197158
    • Publication date Jun 23, 2022
    • ASML NETHERLANDS B.V.
    • Sander Catharina Reinier DERKS
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

    • Publication number 20200227311
    • Publication date Jul 16, 2020
    • NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
    • Violeta Navarro Paredes
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF AND SYSTEM FOR DETERMINING AN OVERLAY OR ALIGNMENT ERROR...

    • Publication number 20190378769
    • Publication date Dec 12, 2019
    • NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
    • Violeta Navarro Paredes
    • G01 - MEASURING TESTING