Violeta Petrescu

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Vosselaar, BE

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring physical operating parameters of an integrated circuit
- Patent number 7,928,882
- Issue date Apr 19, 2011
- NXP B.V.
- Hendricus J M Veendrick
- G01 - MEASURING TESTING
Information Patent Grant
Supply voltage monitoring
- Patent number 7,538,570
- Issue date May 26, 2009
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device with test structure and semiconductor device t...
- Publication number 20100315114
- Publication date Dec 16, 2010
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
Supply Voltage Monitoring
- Publication number 20080191732
- Publication date Aug 14, 2008
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
Monnitoring Physical Operating Parameters Of An Integrated Circuit
- Publication number 20080007246
- Publication date Jan 10, 2008
- Koninklijke Philips Electronics N.V.
- Hendricus J.M. Veendrick
- G01 - MEASURING TESTING