Virgil B. Elings

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 8,087,288
- Issue date Jan 3, 2012
- Bruker Nano, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for atomic force microscopy
- Patent number 6,642,517
- Issue date Nov 4, 2003
- Veeco Instruments, Inc.
- Lucien P. Ghislain
- G01 - MEASURING TESTING
Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE37203
- Issue date Jun 5, 2001
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Capacitance atomic force microscopes and methods of operating such...
- Patent number 6,172,506
- Issue date Jan 9, 2001
- Veeco Instruments Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 6,032,518
- Issue date Mar 7, 2000
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope with phase or frequency detection
- Patent number RE36488
- Issue date Jan 11, 2000
- Veeco Instruments Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Method for improving the operation of oscillating mode atomic force...
- Patent number 6,008,489
- Issue date Dec 28, 1999
- Digital Instruments
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe optical microscope using a solid immersion lens
- Patent number 5,939,709
- Issue date Aug 17, 1999
- Lucien P. Ghislain
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for obtaining improved vertical metrology meas...
- Patent number 5,898,106
- Issue date Apr 27, 1999
- Digital Instruments, Inc.
- Kenneth L. Babcock
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for measuring properties of dielectric and...
- Patent number 5,874,734
- Issue date Feb 23, 1999
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring mechanical properties on a small...
- Patent number 5,866,807
- Issue date Feb 2, 1999
- Digital Instruments
- Jeffrey R. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,714,682
- Issue date Feb 3, 1998
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having automatic probe exchange and align...
- Patent number 5,705,814
- Issue date Jan 6, 1998
- Digital Instruments, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,560,244
- Issue date Oct 1, 1996
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scan control for scanning probe microscopes
- Patent number 5,557,156
- Issue date Sep 17, 1996
- Digital Instruments, Inc.
- Virgil Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,553,487
- Issue date Sep 10, 1996
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope with phase or frequency detection
- Patent number 5,519,212
- Issue date May 21, 1996
- Digital Instruments, Incorporated
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,463,897
- Issue date Nov 7, 1995
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,418,363
- Issue date May 23, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,415,027
- Issue date May 16, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope
- Patent number 5,412,980
- Issue date May 9, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,400,647
- Issue date Mar 28, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,329,808
- Issue date Jul 19, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,308,974
- Issue date May 3, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning device for scanning probe microscopes
- Patent number 5,306,919
- Issue date Apr 26, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,266,801
- Issue date Nov 30, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for small samples having dual-mode operatin...
- Patent number 5,253,516
- Issue date Oct 19, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,237,859
- Issue date Aug 24, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE34331
- Issue date Aug 3, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Jumping probe microscope
- Patent number 5,229,606
- Issue date Jul 20, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IMPROVING A FLEXURE STAGE
- Publication number 20020005679
- Publication date Jan 17, 2002
- VIRGIL B. ELINGS
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Virgil B. Elings

Person

Patents Grantslast 30 patents

Scanning stylus atomic force microscope with cantilever tracking an...

Method and apparatus for atomic force microscopy

Feedback control for scanning tunnel microscopes

Capacitance atomic force microscopes and methods of operating such...

Scanning stylus atomic force microscope with cantilever tracking an...

Tapping atomic force microscope with phase or frequency detection

Method for improving the operation of oscillating mode atomic force...

Scanning probe optical microscope using a solid immersion lens

Method and apparatus for obtaining improved vertical metrology meas...

Atomic force microscope for measuring properties of dielectric and...

Method and apparatus for measuring mechanical properties on a small...

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning probe microscope having automatic probe exchange and align...

Scanning stylus atomic force microscope with cantilever tracking an...

Scan control for scanning probe microscopes

Methods of operating atomic force microscopes to measure friction

Tapping atomic force microscope with phase or frequency detection

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning probe microscope using stored data for vertical probe posi...

Jumping probe microscope

Tapping atomic force microscope

Methods of operating atomic force microscopes to measure friction

Atomic force microscope

Scanning probe microscope using stored data for vertical probe posi...

Positioning device for scanning probe microscopes

Jumping probe microscope

Atomic force microscope for small samples having dual-mode operatin...

Atomic force microscope

Feedback control for scanning tunnel microscopes

Jumping probe microscope

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR IMPROVING A FLEXURE STAGE