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Vishal Gupta
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Noida, IN
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Patents Grants
last 30 patents
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Patent Grant
System and method for scan chain re-ordering
Patent number
8,839,061
Issue date
Sep 16, 2014
Freescale Semiconductor, Inc.
Puneet Dodeja
G01 - MEASURING TESTING
Information
Patent Grant
Configurable circuit and mesh structure for integrated circuit
Patent number
8,645,892
Issue date
Feb 4, 2014
FREESCALE SEMICONDUCTOR, INC.
Vishal Gupta
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Scan chain re-ordering in electronic circuit design based on region...
Patent number
8,443,326
Issue date
May 14, 2013
FREESCALE SEMICONDUCTOR, INC.
Vishal Gupta
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR SCAN CHAIN RE-ORDERING
Publication number
20140223249
Publication date
Aug 7, 2014
Puneet Dodeja
G01 - MEASURING TESTING