Vivek Kumar JAIN

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process variability aware adaptive inspection and metrology
- Patent number 12,092,965
- Issue date Sep 17, 2024
- ASML Netherlands B.V.
- Venugopal Vellanki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for pattern fidelity control
- Patent number 11,669,020
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Tanbir Hasan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process variability aware adaptive inspection and metrology
- Patent number 11,003,093
- Issue date May 11, 2021
- ASML Netherlands B.V.
- Venugopal Vellanki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for pattern fidelity control
- Patent number 10,908,515
- Issue date Feb 2, 2021
- ASML Netherlands B.V.
- Tanbir Hasan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for defect validation
- Patent number 10,859,926
- Issue date Dec 8, 2020
- ASML Netherlands B.V.
- Stefan Hunsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process variability aware adaptive inspection and metrology
- Patent number 10,514,614
- Issue date Dec 24, 2019
- ASML Netherlands B.V.
- Venugopal Vellanki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DECOUPLING SOURCES OF VARIATION RELATED TO SEMICONDUCTOR...
- Publication number 20240142959
- Publication date May 2, 2024
- ASML NETHERLANDS B.V.
- Jill Elizabeth FREEMAN
- G05 - CONTROLLING REGULATING
Information Patent Application
DETERMINING HOT SPOT RANKING BASED ON WAFER MEASUREMENT
- Publication number 20220035256
- Publication date Feb 3, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY
- Publication number 20210255548
- Publication date Aug 19, 2021
- ASML NETHERLANDS B.V.
- Venugopal VELLANKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PATTERN FIDELITY CONTROL
- Publication number 20210181642
- Publication date Jun 17, 2021
- ASML NETHERLANDS B.V.
- Tanbir HASAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY
- Publication number 20200096871
- Publication date Mar 26, 2020
- ASML NETHERLANDS B.V.
- Venugopal VELLANKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PATTERN FIDELITY CONTROL
- Publication number 20200019069
- Publication date Jan 16, 2020
- ASML NETHERLANDS B.V.
- Tanbir HASAN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS FOR DEFECT VALIDATION
- Publication number 20180173104
- Publication date Jun 21, 2018
- ASML NETHERLANDS B.V.
- Stefan HUNSCHE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY
- Publication number 20180031981
- Publication date Feb 1, 2018
- ASML NETHERLANDS B.V.
- Venugopal VELLANKI
- G06 - COMPUTING CALCULATING COUNTING

Vivek Kumar JAIN

Person

Patents Grantslast 30 patents

Process variability aware adaptive inspection and metrology

Method and apparatus for pattern fidelity control

Process variability aware adaptive inspection and metrology

Method and apparatus for pattern fidelity control

Methods for defect validation

Process variability aware adaptive inspection and metrology

Patents Applicationslast 30 patents

METHOD FOR DECOUPLING SOURCES OF VARIATION RELATED TO SEMICONDUCTOR...

DETERMINING HOT SPOT RANKING BASED ON WAFER MEASUREMENT

PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR PATTERN FIDELITY CONTROL

PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR PATTERN FIDELITY CONTROL

METHODS FOR DEFECT VALIDATION

PROCESS VARIABILITY AWARE ADAPTIVE INSPECTION AND METROLOGY