Vivekanand Kini

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspection of scattered hot spot areas on...
- Patent number 10,217,605
- Issue date Feb 26, 2019
- KLA-Tencor Corporation
- Sean X. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,734,987
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspection of scattered hot spot areas on...
- Patent number 9,281,164
- Issue date Mar 8, 2016
- KLA-Tencor Corporation
- Sean X. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,257,260
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF SCATTERED HOT SPOT AREAS ON...
- Publication number 20160260577
- Publication date Sep 8, 2016
- KLA-Tencor Corporation
- Sean X. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20160155605
- Publication date Jun 2, 2016
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20140319342
- Publication date Oct 30, 2014
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF SCATTERED HOT SPOT AREAS ON...
- Publication number 20120145894
- Publication date Jun 14, 2012
- Sean X. WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING