Vladimir Dribinski

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 12,152,316
- Issue date Nov 26, 2024
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 11,227,770
- Issue date Jan 18, 2022
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 11,180,866
- Issue date Nov 23, 2021
- KLA Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Grant
193nm laser and inspection system
- Patent number 10,439,355
- Issue date Oct 8, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
183 nm CW laser and inspection system
- Patent number 10,429,719
- Issue date Oct 1, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 10,283,366
- Issue date May 7, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
183NM laser and inspection system
- Patent number 10,199,149
- Issue date Feb 5, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 10,193,293
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
183 nm CW laser and inspection system
- Patent number 10,175,555
- Issue date Jan 8, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,972,959
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,935,421
- Issue date Apr 3, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,793,673
- Issue date Oct 17, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
183NM laser and inspection system
- Patent number 9,748,729
- Issue date Aug 29, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
193 nm laser and an inspection system using a 193 nm laser
- Patent number 9,608,399
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,529,182
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 9,459,215
- Issue date Oct 4, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Alleviation of laser-induced damage in optical materials by suppres...
- Patent number 9,461,435
- Issue date Oct 4, 2016
- KLA-Tencor Corporation
- Vladimir Dribinski
- G02 - OPTICS
Information Patent Grant
Laser assembly and inspection system using monolithic bandwidth nar...
- Patent number 9,419,407
- Issue date Aug 16, 2016
- KLA-Tencor Corporation
- Yujun Deng
- G01 - MEASURING TESTING
Information Patent Grant
Multi-stage ramp-up annealing for frequency-conversion crystals
- Patent number 9,413,134
- Issue date Aug 9, 2016
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
193nm laser and inspection system
- Patent number 9,318,869
- Issue date Apr 19, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 9,250,178
- Issue date Feb 2, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Laser with high quality, stable output beam, and long life high con...
- Patent number 9,097,683
- Issue date Aug 4, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
Alleviation of laser-induced damage in optical materials by suppres...
- Patent number 9,059,560
- Issue date Jun 16, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- G02 - OPTICS
Information Patent Grant
CLBO crystal growth
- Patent number 9,023,152
- Issue date May 5, 2015
- KLA-Tencor Corporation
- Vladimir L. Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Grant
193NM laser and inspection system
- Patent number 8,929,406
- Issue date Jan 6, 2015
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Laser with high quality, stable output beam, and long life high con...
- Patent number 8,873,596
- Issue date Oct 28, 2014
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
Coherent light generation below about two-hundred nanometers
- Patent number 8,755,417
- Issue date Jun 17, 2014
- KLA-Tencor Corporation
- Vladimir L. Dribinski
- G02 - OPTICS
Information Patent Grant
Alleviation of laser-induced damage in optical materials by suppres...
- Patent number 8,711,896
- Issue date Apr 29, 2014
- KLA-Tencor Corporation
- Vladimir Dribinski
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Passivation of Nonlinear Optical Crystals
- Publication number 20190198330
- Publication date Jun 27, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
183 nm CW Laser and Inspection System
- Publication number 20190107766
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
In-Situ Passivation for Nonlinear Optical Crystals
- Publication number 20190056637
- Publication date Feb 21, 2019
- KLA-Tencor Corporation
- Mandar Paranjape
- C30 - CRYSTAL GROWTH
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20180233872
- Publication date Aug 16, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20180191126
- Publication date Jul 5, 2018
- Yung-Ho Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
183 nm CW Laser And Inspection System
- Publication number 20180188633
- Publication date Jul 5, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
183NM Laser And Inspection System
- Publication number 20170323716
- Publication date Nov 9, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System Using 193nm Laser
- Publication number 20170229829
- Publication date Aug 10, 2017
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20170063026
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Passivation of Nonlinear Optical Crystals
- Publication number 20170025281
- Publication date Jan 26, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
Inspection System Using 193nm Laser
- Publication number 20160365693
- Publication date Dec 15, 2016
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20160285223
- Publication date Sep 29, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Passivation of Nonlinear Optical Crystals
- Publication number 20160169815
- Publication date Jun 16, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
183NM Laser And Inspection System
- Publication number 20160099540
- Publication date Apr 7, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
Laser Assembly And Inspection System Using Monolithic Bandwidth Nar...
- Publication number 20160094011
- Publication date Mar 31, 2016
- KLA-Tencor Corporation
- Yujun Deng
- G01 - MEASURING TESTING
Information Patent Application
193nm Laser And An Inspection System Using A 193nm Laser
- Publication number 20160056606
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
Multi-Stage Ramp-Up Annealing For Frequency-Conversion Crystals
- Publication number 20150299893
- Publication date Oct 22, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Application
Alleviation Of Laser-Induced Damage In Optical Materials By Suppres...
- Publication number 20150222079
- Publication date Aug 6, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
193NM Laser And Inspection System
- Publication number 20150155680
- Publication date Jun 4, 2015
- KLA-Tencor Corporation
- Yung-Ho Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
- Publication number 20150022805
- Publication date Jan 22, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Application
CLBO Crystal Growth
- Publication number 20150007765
- Publication date Jan 8, 2015
- KLA-Tencor Corporation
- Vladimir L. Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Application
Passivation of Nonlinear Optical Crystals
- Publication number 20140305367
- Publication date Oct 16, 2014
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Application
193nm Laser And Inspection System
- Publication number 20140226140
- Publication date Aug 14, 2014
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
193NM Laser And Inspection System
- Publication number 20140204963
- Publication date Jul 24, 2014
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Alleviation Of Laser-Induced Damage In Optical Materials By Suppres...
- Publication number 20140198818
- Publication date Jul 17, 2014
- KLA-Tencor Corporation
- Vladimir Dribinski
- G02 - OPTICS
Information Patent Application
Solid-State Laser And Inspection System Using 193nm Laser
- Publication number 20130313440
- Publication date Nov 28, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
HYDROGEN PASSIVATION OF NONLINEAR OPTICAL CRYSTALS
- Publication number 20130088706
- Publication date Apr 11, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- C30 - CRYSTAL GROWTH
Information Patent Application
Solid-State Laser And Inspection System Using 193nm Laser
- Publication number 20130077086
- Publication date Mar 28, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
- Publication number 20130021602
- Publication date Jan 24, 2013
- KLA-Tencor Corporation
- Vladimir Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20120314286
- Publication date Dec 13, 2012
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS

Vladimir Dribinski

Person

Patents Grantslast 30 patents

Passivation of nonlinear optical crystals

Passivation of nonlinear optical crystals

Passivation of nonlinear optical crystals

193nm laser and inspection system

183 nm CW laser and inspection system

Passivation of nonlinear optical crystals

183NM laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

183 nm CW laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

193nm laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

183NM laser and inspection system

193 nm laser and an inspection system using a 193 nm laser

193nm laser and inspection system

Passivation of nonlinear optical crystals

Alleviation of laser-induced damage in optical materials by suppres...

Laser assembly and inspection system using monolithic bandwidth nar...

Multi-stage ramp-up annealing for frequency-conversion crystals

193nm laser and inspection system

Passivation of nonlinear optical crystals

Laser with high quality, stable output beam, and long life high con...

Alleviation of laser-induced damage in optical materials by suppres...

CLBO crystal growth

193NM laser and inspection system

Laser with high quality, stable output beam, and long life high con...

Coherent light generation below about two-hundred nanometers

Alleviation of laser-induced damage in optical materials by suppres...

Patents Applicationslast 30 patents

Passivation of Nonlinear Optical Crystals

183 nm CW Laser and Inspection System

In-Situ Passivation for Nonlinear Optical Crystals

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

193nm Laser And Inspection System

183 nm CW Laser And Inspection System

183NM Laser And Inspection System

Inspection System Using 193nm Laser

193nm Laser And Inspection System

Passivation of Nonlinear Optical Crystals

Inspection System Using 193nm Laser

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

Passivation of Nonlinear Optical Crystals

183NM Laser And Inspection System

Laser Assembly And Inspection System Using Monolithic Bandwidth Nar...

193nm Laser And An Inspection System Using A 193nm Laser

Multi-Stage Ramp-Up Annealing For Frequency-Conversion Crystals

Alleviation Of Laser-Induced Damage In Optical Materials By Suppres...

193NM Laser And Inspection System

Laser With High Quality, Stable Output Beam, And Long Life High Con...

CLBO Crystal Growth

Passivation of Nonlinear Optical Crystals

193nm Laser And Inspection System

193NM Laser And Inspection System

Alleviation Of Laser-Induced Damage In Optical Materials By Suppres...

Solid-State Laser And Inspection System Using 193nm Laser

HYDROGEN PASSIVATION OF NONLINEAR OPTICAL CRYSTALS

Solid-State Laser And Inspection System Using 193nm Laser

Laser With High Quality, Stable Output Beam, And Long Life High Con...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...