Vladimir Kamenetsky

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Migdal Haemek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for providing a quality metric for improved proce...
- Patent number 11,372,340
- Issue date Jun 28, 2022
- KLA Corporation
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Providing a Quality Metric for Improved Proce...
- Publication number 20230051705
- Publication date Feb 16, 2023
- KLA Corporation
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING A QUALITY METRIC FOR IMPROVED PROCE...
- Publication number 20130035888
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING