Vladimir Kogan

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder for X-ray analysis
- Patent number 10,359,376
- Issue date Jul 23, 2019
- Malvern Panalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection in packaging
- Patent number 7,756,248
- Issue date Jul 13, 2010
- PANalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction equipment for X-ray scattering
- Patent number 7,542,547
- Issue date Jun 2, 2009
- PANalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for correcting for aberrations
- Patent number 7,516,031
- Issue date Apr 7, 2009
- PANalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus provided with a multilayer mirror and an e...
- Patent number 6,704,390
- Issue date Mar 9, 2004
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for radiation analysis with a variable collimator
- Patent number 6,444,993
- Issue date Sep 3, 2002
- Koninklijke Philips Electronics N.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus including a parabolic X-ray mirror and a c...
- Patent number 6,359,964
- Issue date Mar 19, 2002
- U.S. Philips Corporation
- Vladimir A. Kogan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
- Publication number 20230296536
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder for X-ray Analysis
- Publication number 20180024081
- Publication date Jan 25, 2018
- PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION IN PACKAGING
- Publication number 20090232276
- Publication date Sep 17, 2009
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Diffraction Equipment for X-Ray Scattering
- Publication number 20080175352
- Publication date Jul 24, 2008
- PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for correcting for abberations
- Publication number 20060206278
- Publication date Sep 14, 2006
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
X-ray analysis apparatus provided with a multilayer mirror and an e...
- Publication number 20020003859
- Publication date Jan 10, 2002
- Vladimir Kogan
- G01 - MEASURING TESTING