Vladimir Kovalev

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test mode soft reset circuitry and methods
- Patent number 8,266,485
- Issue date Sep 11, 2012
- SanDisk Technologies Inc.
- Baojing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Test mode soft reset circuitry and methods
- Patent number 7,962,819
- Issue date Jun 14, 2011
- SanDisk Corporation
- Baojing Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR REDUCED PIN LOGIC SCANNING
- Publication number 20150185285
- Publication date Jul 2, 2015
- SANDISK TECHNOLOGIES INC.
- Vladimir Kovalev
- G01 - MEASURING TESTING
Information Patent Application
Test Mode Soft Reset Circuitry and Methods
- Publication number 20110246844
- Publication date Oct 6, 2011
- SANDISK CORPORATION
- Baojing Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST MODE SOFT RESET CIRCUITRY AND METHODS
- Publication number 20090193305
- Publication date Jul 30, 2009
- SANDISK CORPORATION
- Baojing Liu
- G06 - COMPUTING CALCULATING COUNTING