Vladimir Machavariani

Person

Rishon Lezion, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 12,066,385
- Issue date Aug 20, 2024
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM-based metrology method and system
- Patent number 11,710,616
- Issue date Jul 25, 2023
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and system
- Patent number 11,450,541
- Issue date Sep 20, 2022
- Nova Ltd.
- Vladimir Machavariani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM-based metrology method and system
- Patent number 11,309,162
- Issue date Apr 19, 2022
- Nova Ltd.
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 11,275,027
- Issue date Mar 15, 2022
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM-based metrology method and system
- Patent number 10,916,404
- Issue date Feb 9, 2021
- Nova Measuring Instruments Ltd.
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for optical metrology in patterned structures
- Patent number 10,761,036
- Issue date Sep 1, 2020
- Nova Measuring Instruments Ltd.
- Boris Levant
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 10,564,106
- Issue date Feb 18, 2020
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for optical metrology in patterned structures
- Patent number 10,274,435
- Issue date Apr 30, 2019
- Nova Measuring Instruments Ltd.
- Boris Levant
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurements of patterned structures
- Patent number 7,187,456
- Issue date Mar 6, 2007
- Nova Measuring Instruments Ltd.
- David Scheiner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurements of patterned structures
- Patent number 7,123,366
- Issue date Oct 17, 2006
- Nova Measuring Instruments Ltd.
- David Scheiner
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring a process of material removal from...
- Patent number 6,885,446
- Issue date Apr 26, 2005
- Nova Measuring Instruments Ltd.
- Vladimir Machavariani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurements of patterned structures
- Patent number 6,836,324
- Issue date Dec 28, 2004
- Nova Measuring Instruments Ltd.
- David Scheiner
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for metal CMP process control
- Patent number 6,654,108
- Issue date Nov 25, 2003
- Nova Measuring Instruments Ltd.
- Avi Ravid
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for measurements of patterned structures
- Patent number 6,476,920
- Issue date Nov 5, 2002
- Nova Measuring Instruments, Ltd.
- David Scheiner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT
- Publication number 20240068964
- Publication date Feb 29, 2024
- NOVA LTD
- Shahar Gov
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20230074398
- Publication date Mar 9, 2023
- NOVA LTD
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20220326159
- Publication date Oct 13, 2022
- NOVA LTD
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20220310356
- Publication date Sep 29, 2022
- NOVA LTD
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20210217581
- Publication date Jul 15, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20200294829
- Publication date Sep 17, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20200256799
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20190393016
- Publication date Dec 26, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES
- Publication number 20190317024
- Publication date Oct 17, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Boris LEVANT
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20180372644
- Publication date Dec 27, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES
- Publication number 20180052119
- Publication date Feb 22, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Boris LEVANT
- G01 - MEASURING TESTING
Information Patent Application
Method and appratus for measurements of patterned structures
- Publication number 20050146729
- Publication date Jul 7, 2005
- NOVA MEASURING INSTRUMENTS LTD.
- David Scheiner
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measurements of patterned structures
- Publication number 20050062965
- Publication date Mar 24, 2005
- NOVA MEASURING INSTRUMENTS LTD.
- David Scheiner
- G01 - MEASURING TESTING
Information Patent Application
Method and system for monitoring a process of material removal from...
- Publication number 20030155537
- Publication date Aug 21, 2003
- NOVA MEASURING INSTRUMENTS LTD.
- Vladimir Machavariani
- G01 - MEASURING TESTING
Information Patent Application
Test structure for metal CMP process control
- Publication number 20010026364
- Publication date Oct 4, 2001
- Nova Measuring Instruments Ltd.
- Avi Ravid
- B24 - GRINDING POLISHING
Information Patent Application
Test structure for metal CMP process control
- Publication number 20010015811
- Publication date Aug 23, 2001
- Nova Measuring Instruments Ltd.
- Avi Ravid
- B24 - GRINDING POLISHING

Vladimir Machavariani

Person

Patents Grantslast 30 patents

Raman spectroscopy based measurements in patterned structures

TEM-based metrology method and system

Metrology method and system

TEM-based metrology method and system

Raman spectroscopy based measurements in patterned structures

TEM-based metrology method and system

Method and system for optical metrology in patterned structures

Raman spectroscopy based measurements in patterned structures

Method and system for optical metrology in patterned structures

Method and apparatus for measurements of patterned structures

Method and apparatus for measurements of patterned structures

Method and system for monitoring a process of material removal from...

Method and apparatus for measurements of patterned structures

Test structure for metal CMP process control

Method and apparatus for measurements of patterned structures

Patents Applicationslast 30 patents

EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT

METROLOGY METHOD AND SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

TEM-BASED METROLOGY METHOD AND SYSTEM

TEM-BASED METROLOGY METHOD AND SYSTEM

METROLOGY METHOD AND SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

TEM-BASED METROLOGY METHOD AND SYSTEM

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES

Method and appratus for measurements of patterned structures

Method and apparatus for measurements of patterned structures

Method and system for monitoring a process of material removal from...

Test structure for metal CMP process control

Test structure for metal CMP process control