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Vladimir N. Faifer
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for measuring electrical characteristics of a m...
Patent number
11,442,090
Issue date
Sep 13, 2022
UTICA LEASECO, LLC
Jan Moritz Limpinsel
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-contact measurement of sheet resistanc...
Patent number
9,921,261
Issue date
Mar 20, 2018
KLA-Tencor Corporation
Vladimir N. Faifer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-contact measurement of forward voltage...
Patent number
9,880,200
Issue date
Jan 30, 2018
KLA-Tencor Corporation
Vladimir N. Faifer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for non-contact measurement of internal quantu...
Patent number
9,823,198
Issue date
Nov 21, 2017
KLA-Tencor Corporation
Vladimir N. Faifer
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for accurate measurement and mapping of forwar...
Patent number
9,746,514
Issue date
Aug 29, 2017
KLA-Tencor Corporation
Ian Sierra Gabriel Kelly-Morgan
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING ELECTRICAL CHARACTERISTICS OF A M...
Publication number
20210003628
Publication date
Jan 7, 2021
Alta Devices, Inc.
Jan Moritz Limpinsel
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Non-Contact Measurement of Sheet Resistanc...
Publication number
20150241512
Publication date
Aug 27, 2015
KLA-Tencor Corporation
Vladimir N. Faifer
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Non-Contact Measurement of Internal Quantu...
Publication number
20150077741
Publication date
Mar 19, 2015
KLA-Tencor Corporation
Vladimir N. Faifer
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Accurate Measurement and Mapping of Forwar...
Publication number
20150061714
Publication date
Mar 5, 2015
KLA-Tencor Corporation
Ian Sierra Gabriel Kelly-Morgan
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Non-Contact Measurement of Forward Voltage...
Publication number
20150061715
Publication date
Mar 5, 2015
KLA-Tencor Corporation
Vladimir N. Faifer
G01 - MEASURING TESTING