Vladimir Vayner

Person

Needham, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Manipulator in automatic test equipment
- Patent number 10,094,854
- Issue date Oct 9, 2018
- Teradyne, Inc.
- Gary Fowler
- G01 - MEASURING TESTING
Information Patent Grant
Braking system
- Patent number 10,060,475
- Issue date Aug 28, 2018
- Teradyne, Inc.
- Roger Allen Sinsheimer
- G01 - MEASURING TESTING
Information Patent Grant
Pocketed circuit board
- Patent number 9,786,977
- Issue date Oct 10, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser targeting mechanism
- Patent number 8,471,587
- Issue date Jun 25, 2013
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Grant
Laser targeting mechanism
- Patent number 7,847,570
- Issue date Dec 7, 2010
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment interface
- Patent number 7,733,081
- Issue date Jun 8, 2010
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Grant
Rear-mounted gimbal for supporting test head
- Patent number 7,135,854
- Issue date Nov 14, 2006
- Teradyne, Inc.
- Bosy J. Brian
- G01 - MEASURING TESTING
Information Patent Grant
Rear-mounted gimbal for supporting test head
- Patent number 6,828,774
- Issue date Dec 7, 2004
- Teradyne, Inc.
- Brian J. Bosy
- G01 - MEASURING TESTING
Information Patent Grant
Fixture for assembling parts of a device such as a Wien filter
- Patent number 6,678,932
- Issue date Jan 20, 2004
- Schlumberger Technologies, Inc.
- Paul J. Duval
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter for use in a scanning electron microscope or the like
- Patent number 6,593,578
- Issue date Jul 15, 2003
- Schlumberger Technologies, Inc.
- Paul J. Duval
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Pocketed Circuit Board
- Publication number 20170170537
- Publication date Jun 15, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANIPULATOR IN AUTOMATIC TEST EQUIPMENT
- Publication number 20170115327
- Publication date Apr 27, 2017
- Teradyne, Inc.
- Gary Fowler
- G01 - MEASURING TESTING
Information Patent Application
Braking System
- Publication number 20160186804
- Publication date Jun 30, 2016
- Teradyne, Inc.
- Roger Allen Sinsheimer
- G01 - MEASURING TESTING
Information Patent Application
Laser Targeting Mechanism
- Publication number 20110037982
- Publication date Feb 17, 2011
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Application
Laser Targeting Mechanism
- Publication number 20090102498
- Publication date Apr 23, 2009
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Application
Automated Test Equipment Interface
- Publication number 20090102457
- Publication date Apr 23, 2009
- Teradyne, Inc.
- Vladimir Vayner
- G01 - MEASURING TESTING
Information Patent Application
Rear-mounted gimbal for supporting test head
- Publication number 20050127897
- Publication date Jun 16, 2005
- Teradyne, Inc.
- Brian J. Bosy
- G01 - MEASURING TESTING
Information Patent Application
Rear-mounted gimbal for supporting test head
- Publication number 20030160604
- Publication date Aug 28, 2003
- Brian J. Bosy
- G01 - MEASURING TESTING

Vladimir Vayner

Person

Patents Grantslast 30 patents

Manipulator in automatic test equipment

Braking system

Pocketed circuit board

Laser targeting mechanism

Laser targeting mechanism

Automated test equipment interface

Rear-mounted gimbal for supporting test head

Rear-mounted gimbal for supporting test head

Fixture for assembling parts of a device such as a Wien filter

Wien filter for use in a scanning electron microscope or the like

Patents Applicationslast 30 patents

Pocketed Circuit Board

MANIPULATOR IN AUTOMATIC TEST EQUIPMENT

Braking System

Laser Targeting Mechanism

Laser Targeting Mechanism

Automated Test Equipment Interface

Rear-mounted gimbal for supporting test head

Rear-mounted gimbal for supporting test head