Volker Drexel

Person

Konigsbronn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Particle source for producing a particle beam and particle-optical...
- Patent number 10,446,360
- Issue date Oct 15, 2019
- Carl Zeiss Microscopy GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,723,138
- Issue date May 13, 2014
- Carl Zeiss Microscopy GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,536,773
- Issue date Sep 17, 2013
- Carl Zeiss Microscopy GmbH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 8,431,894
- Issue date Apr 30, 2013
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens
- Patent number 8,362,443
- Issue date Jan 29, 2013
- Carl Zeiss Microscopy GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens
- Patent number 8,178,849
- Issue date May 15, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,164,071
- Issue date Apr 24, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,910,887
- Issue date Mar 22, 2011
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,507,962
- Issue date Mar 24, 2009
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for variable pressure areas and an electron microscope com...
- Patent number 7,462,839
- Issue date Dec 9, 2008
- Carl Zeiss NTS GmbH
- Peter Gnauck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,425,701
- Issue date Sep 16, 2008
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector system for a particle beam apparatus, and particle beam ap...
- Patent number 7,060,978
- Issue date Jun 13, 2006
- Carl Zeiss NTS GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device with a particle source to be operated in high...
- Patent number 6,872,956
- Issue date Mar 29, 2005
- Carl Zeiss NTS GmbH
- Peter Gnauck
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Particle beam device
- Patent number 6,498,345
- Issue date Dec 24, 2002
- LEO Elektronenmikroskopie GmbH
- Eugen Weimer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE SOURCE FOR PRODUCING A PARTICLE BEAM AND PARTICLE-OPTICAL...
- Publication number 20180330912
- Publication date Nov 15, 2018
- CARL ZEISS MICROSCOPY GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120248959
- Publication date Oct 4, 2012
- CARL ZEISS NTS GMBH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS
- Publication number 20120205550
- Publication date Aug 16, 2012
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120131785
- Publication date May 31, 2012
- NANOTOOLS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100078557
- Publication date Apr 1, 2010
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS
- Publication number 20100038538
- Publication date Feb 18, 2010
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-beam device and detector system
- Publication number 20090309024
- Publication date Dec 17, 2009
- MICHAEL D.G. STEIGERWALD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device
- Publication number 20090039257
- Publication date Feb 12, 2009
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-beam device and detector system
- Publication number 20070120071
- Publication date May 31, 2007
- Michael D.G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for variable pressure areas and an electron microscope com...
- Publication number 20050173644
- Publication date Aug 11, 2005
- Peter Gnauck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam device with a particle source to be operated in high...
- Publication number 20040076529
- Publication date Apr 22, 2004
- Peter Gnauck
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Detector system for a particle beam apparatus, and particle beam ap...
- Publication number 20020011565
- Publication date Jan 31, 2002
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS

Volker Drexel

Person

Patents Grantslast 30 patents

Particle source for producing a particle beam and particle-optical...

Electron beam source and method of manufacturing the same

Electron beam source and method of manufacturing the same

Electron beam device

Objective lens

Objective lens

Electron beam source and method of manufacturing the same

Electron-beam device and detector system

Electron-beam device and detector system

Detector for variable pressure areas and an electron microscope com...

Electron-beam device and detector system

Detector system for a particle beam apparatus, and particle beam ap...

Particle beam device with a particle source to be operated in high...

Particle beam device

Patents Applicationslast 30 patents

PARTICLE SOURCE FOR PRODUCING A PARTICLE BEAM AND PARTICLE-OPTICAL...

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

OBJECTIVE LENS

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

OBJECTIVE LENS

Electron-beam device and detector system

Electron beam device

Electron-beam device and detector system

Detector for variable pressure areas and an electron microscope com...

Particle beam device with a particle source to be operated in high...

Detector system for a particle beam apparatus, and particle beam ap...