Volker Hansel

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspecting method for ensuring scrubbing length on pad
- Patent number 11,703,541
- Issue date Jul 18, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting method
- Patent number 11,693,050
- Issue date Jul 4, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD
- Publication number 20220155365
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD
- Publication number 20220155366
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL
- Publication number 20100029022
- Publication date Feb 4, 2010
- SUSS MicroTec Test Systems GmbH
- Frank FEHRMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING