Volker Höfer

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Stein/Traun, DE

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Patents Grantslast 30 patents

Information Patent Grant
Interferential position measuring arrangement
- Patent number 7,154,609
- Issue date Dec 26, 2006
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring system
- Patent number 7,112,782
- Issue date Sep 26, 2006
- Dr. Johannes Heidenhain GmbH
- Volker Höfer
- G01 - MEASURING TESTING
Information Patent Grant
Positioning device
- Patent number 6,933,700
- Issue date Aug 23, 2005
- Dr. Johannes Heidenhain GmbH
- Johann Lahr
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measuring system
- Patent number 6,552,810
- Issue date Apr 22, 2003
- Dr. Johannes Hiedenhein GmbH
- Michael Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit for an optical position measuring system
- Patent number 6,198,534
- Issue date Mar 6, 2001
- Johannes Heidenhain GmbH
- Volker Höfer
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device
- Patent number 6,175,414
- Issue date Jan 16, 2001
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit with a printed circuit for an optical position-measur...
- Patent number 6,043,482
- Issue date Mar 28, 2000
- Johannes Heidenhain GmbH
- Rainer Hagl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical position measuring system
- Publication number 20050077457
- Publication date Apr 14, 2005
- Dr. Johannes Heidenhain GmbH
- Volker Hofer
- G01 - MEASURING TESTING
Information Patent Application
Interferential position measuring arrangement
- Publication number 20040090637
- Publication date May 13, 2004
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Positioning device
- Publication number 20040012366
- Publication date Jan 22, 2004
- Johann Lahr
- G05 - CONTROLLING REGULATING