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Volker Kilian
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Munchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Loop-back method for measuring the interface timing of semiconducto...
Patent number
7,398,444
Issue date
Jul 8, 2008
Infineon Technologies AG
Martin Brox
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device and method for testing memory devices with repairable...
Patent number
7,349,253
Issue date
Mar 25, 2008
Infineon Technologies AG
Martin Perner
G11 - INFORMATION STORAGE
Information
Patent Grant
Semi-conductor component, as well as a process for the in-or output...
Patent number
7,184,339
Issue date
Feb 27, 2007
Infineon Technologies AG
Thorsten Bucksch
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit for setting a signal propagation time for a signal on a sig...
Patent number
7,113,015
Issue date
Sep 26, 2006
Infineon Technologies AG
Lenart Hauptner
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for generating test signals for an integrated circuit and te...
Patent number
6,870,392
Issue date
Mar 22, 2005
Infineon Technologies AG
Volker Kilian
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for finding a fault in a signal path on a prin...
Patent number
6,867,597
Issue date
Mar 15, 2005
Infineon Technologies AG
Lenart Hauptner
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring a temperature in an electronic comp...
Patent number
6,600,331
Issue date
Jul 29, 2003
Infineon Technologies AG
Volker Kilian
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Memory device and method for testing memory devices with repairable...
Publication number
20060198215
Publication date
Sep 7, 2006
Martin Perner
G11 - INFORMATION STORAGE
Information
Patent Application
Semi-conductor component, as well as a process for the in-or output...
Publication number
20060087900
Publication date
Apr 27, 2006
Infineon Technologies AG
Thorsten Bucksch
G11 - INFORMATION STORAGE
Information
Patent Application
Loop-back method for measuring the interface timing of semiconducto...
Publication number
20060059397
Publication date
Mar 16, 2006
Martin Brox
G01 - MEASURING TESTING
Information
Patent Application
Method for generating test signals for an integrated circuit and te...
Publication number
20030159098
Publication date
Aug 21, 2003
Volker Kilian
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for finding a fault in a signal path on a prin...
Publication number
20030090273
Publication date
May 15, 2003
Lenart Hauptner
G01 - MEASURING TESTING
Information
Patent Application
Circuit for setting a signal propagation time for a signal on a sig...
Publication number
20030086578
Publication date
May 8, 2003
Lenart Hauptner
G11 - INFORMATION STORAGE
Information
Patent Application
Method and device for measuring a temperature in an electronic comp...
Publication number
20020180472
Publication date
Dec 5, 2002
Volker Kilian
G01 - MEASURING TESTING