Volker Knorz

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Huttenberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for inspecting an object
- Patent number 7,271,889
- Issue date Sep 18, 2007
- Leica Microsystems CMS GmbH
- Franz Cemic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device and method for inspecting an object
- Publication number 20050259245
- Publication date Nov 24, 2005
- LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
- Franz Cemic
- G02 - OPTICS