Volker Rossiger

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Sindelfingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measurement of the thickness of thin layers
- Patent number 7,076,021
- Issue date Jul 11, 2006
- Immobiliengesellschaft Helmut Fischer GmbH & Co. KG
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for guiding X-rays
- Patent number 6,438,209
- Issue date Aug 20, 2002
- Helmut Fischer GmbH & Co. Institut fur Elektronik und Messtechnik
- Volker Rössiger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of setting a position of an object of measurement in layer t...
- Patent number 6,370,221
- Issue date Apr 9, 2002
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Karl-Heinz Kaiser
- G01 - MEASURING TESTING
Information Patent Grant
Determination of the measuring spot during x-ray fluorescence analysis
- Patent number 6,364,528
- Issue date Apr 2, 2002
- Immobiliengesellschaft Helmut Fischer GmbH & Co. KG
- Volker Rössiger
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the thicknesses of thin layers b...
- Patent number 6,038,280
- Issue date Mar 14, 2000
- Helmut Fischer GmbH & Co. Institut Fur Electronik Und Messtechnik
- Volker Rossiger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MIRROR, X-RAY FLUORESCENCE ANALYSIS DEVICE, AND METHOD FOR...
- Publication number 20150362639
- Publication date Dec 17, 2015
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Volker Rossiger
- G02 - OPTICS