Volker Weiss

Person

Syracuse, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Internal material condition monitoring for control
- Patent number 8,981,018
- Issue date Mar 17, 2015
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G05 - CONTROLLING REGULATING
Information Patent Grant
Remaining life prediction for individual components from sparse data
- Patent number 8,768,657
- Issue date Jul 1, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Quasistatic magnetic and electric field stress/strain gages
- Patent number 7,533,575
- Issue date May 19, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition monitoring with multiple sensing modes
- Patent number 7,451,657
- Issue date Nov 18, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Damage standard fabrication with attached sensor
- Patent number 7,230,421
- Issue date Jun 12, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Self-monitoring metals, alloys and materials
- Patent number 7,188,532
- Issue date Mar 13, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for material property monitoring with perforated, surface mo...
- Patent number 7,161,350
- Issue date Jan 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of samples having predetermined material conditions
- Patent number 7,106,055
- Issue date Sep 12, 2006
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting widespread fatigue and cracks in a metal structure
- Patent number 6,420,867
- Issue date Jul 16, 2002
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
- Publication number 20150160144
- Publication date Jun 11, 2015
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Quasistatic magnetic and electric field stress/strain gages
- Publication number 20070245834
- Publication date Oct 25, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Remaining life prediction for individual components from sparse data
- Publication number 20070239407
- Publication date Oct 11, 2007
- Neil J. Goldfine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Self-monitoring metals, alloys and materials
- Publication number 20070227255
- Publication date Oct 4, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Surface mounted and scanning spatially periodic eddy-current sensor...
- Publication number 20060082366
- Publication date Apr 20, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Internal material condition monitoring for control
- Publication number 20060009865
- Publication date Jan 12, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G05 - CONTROLLING REGULATING
Information Patent Application
Material condition monitoring with multiple sensing modes
- Publication number 20050171703
- Publication date Aug 4, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fabrication of samples having predetermined material conditions
- Publication number 20050146324
- Publication date Jul 7, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Self-monitoring metals, alloys and materials
- Publication number 20050083032
- Publication date Apr 21, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Volker Weiss

Person

Patents Grantslast 30 patents

Internal material condition monitoring for control

Remaining life prediction for individual components from sparse data

Quasistatic magnetic and electric field stress/strain gages

Material condition monitoring with multiple sensing modes

Damage standard fabrication with attached sensor

Self-monitoring metals, alloys and materials

Method for material property monitoring with perforated, surface mo...

Fabrication of samples having predetermined material conditions

Method of detecting widespread fatigue and cracks in a metal structure

Patents Applicationslast 30 patents

INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL

Quasistatic magnetic and electric field stress/strain gages

Remaining life prediction for individual components from sparse data

Self-monitoring metals, alloys and materials

Surface mounted and scanning spatially periodic eddy-current sensor...

Internal material condition monitoring for control

Material condition monitoring with multiple sensing modes

Fabrication of samples having predetermined material conditions

Self-monitoring metals, alloys and materials