W. Clay Schluchter

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Ambient environment index of refraction insensitive optical system
- Patent number 7,420,744
- Issue date Sep 2, 2008
- Agilent Technologies, Inc.
- David M. George
- G02 - OPTICS
Information Patent Grant
High efficiency beam distribution with independent wavefront correc...
- Patent number 7,280,275
- Issue date Oct 9, 2007
- Agilent Technologies, Inc.
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Grant
Heterodyne laser interferometer for measuring wafer stage translation
- Patent number 7,158,236
- Issue date Jan 2, 2007
- Agilent Technologies, Inc.
- W. Clay Schluchter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ambient Environment Index of Refraction Insensitive Optical System
- Publication number 20070115557
- Publication date May 24, 2007
- David M. George
- G02 - OPTICS
Information Patent Application
High efficiency beam distribution with independent wavefront correc...
- Publication number 20070024976
- Publication date Feb 1, 2007
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Application
Heterodyne laser interferometer with porro prisms for measuring sta...
- Publication number 20060017933
- Publication date Jan 26, 2006
- W. Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
Heterodyne laser interferometer for measuring wafer stage translation
- Publication number 20050259268
- Publication date Nov 24, 2005
- W. Clay Schluchter
- G01 - MEASURING TESTING