W. Ferrel Bentley

Person

  • Smyrna, GA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Sector scan ADF system

    • Patent number 4,317,120
    • Issue date Feb 23, 1982
    • The United States of America as represented by the Field Operations Bureau of...
    • W. Ferrel Bentley
    • G01 - MEASURING TESTING