W. Jarrett Campbell

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for estimating error in a manufacturing process
- Patent number 6,718,224
- Issue date Apr 6, 2004
- Yield Dynamics, Inc.
- Stacy Firth
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for controlling critical dimension in a semicondu...
- Patent number 6,643,596
- Issue date Nov 4, 2003
- Yield Dynamics, Inc.
- Stacy K. Firth
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer-less qualification of a processing tool
- Patent number 6,629,012
- Issue date Sep 30, 2003
- Advanced Micro Devices Inc.
- Terrence J. Riley
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for controlling polysilicon feature critical dime...
- Patent number 6,348,289
- Issue date Feb 19, 2002
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for controlling within-wafer uniformity in che...
- Patent number 6,276,989
- Issue date Aug 21, 2001
- Advanced Micro Devices, Inc.
- W. Jarrett Campbell
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
System and method for controlling critical dimension in a semicondu...
- Publication number 20030115005
- Publication date Jun 19, 2003
- Stacy K. Firth
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for estimating error in a manufacturing process
- Publication number 20030055524
- Publication date Mar 20, 2003
- Stacy Firth
- G05 - CONTROLLING REGULATING