W. Ralph Knowles

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Lowell, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system
- Patent number 6,979,822
- Issue date Dec 27, 2005
- FEI Company
- Diane K. Stewart
- G01 - MEASURING TESTING
Information Patent Grant
High temperature specimen stage and detector for an environmental s...
- Patent number 6,025,592
- Issue date Feb 15, 2000
- Philips Electronics North America
- W. Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gaseous backscattered electron detector for an environmental scanni...
- Patent number 5,945,672
- Issue date Aug 31, 1999
- FEI Company
- W. Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission environmental scanning electron microscope
- Patent number 5,828,064
- Issue date Oct 27, 1998
- Philips Electronics North America Corporation
- W. Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental scanning electron microscope
- Patent number 5,412,211
- Issue date May 2, 1995
- ElectroScan Corporation
- W. Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental scanning electron microscope
- Patent number 5,362,964
- Issue date Nov 8, 1994
- ElectroScan Corporation
- W. Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20050279934
- Publication date Dec 22, 2005
- FEI Company
- Diane K. Stewart
- G01 - MEASURING TESTING