Wadgi W. Abadeer

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Jericho, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer level system for producing burn-in/screen, and reliability ev...
- Patent number 6,909,296
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Wadgi W. Abadeer
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level system for producing burn-in/screen, and reliability ev...
- Patent number 6,844,747
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Wadgi W. Abadeer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer level system for producing burn-in/screen, and reliability ev...
- Publication number 20040175851
- Publication date Sep 9, 2004
- International Business Machines Corporation
- Wadgi W. Abadeer
- G01 - MEASURING TESTING
Information Patent Application
Wafer level system for producing burn-in/screen, and reliability ev...
- Publication number 20020132378
- Publication date Sep 19, 2002
- International Business Machines Corporation
- Wadgi W. Abadeer
- G01 - MEASURING TESTING