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Waiman Ng
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Los Gatos, CA, US
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last 30 patents
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Patent Grant
Methods of stabilizing measurement of ArF resist in CD-SEM
Patent number
7,015,468
Issue date
Mar 21, 2006
KLA-Tencor Technologies Corporation
Amir Azordegan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Scanning electron beam microscope
Patent number
6,570,154
Issue date
May 27, 2003
KLA-Tencor Technologies Corporation
Douglas K. Masnaghetti
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Scanning electron beam microscope
Patent number
6,066,849
Issue date
May 23, 2000
KLA Tencor
Douglas K. Masnaghetti
H01 - BASIC ELECTRIC ELEMENTS