Waisum Wong

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for test structure on a wafer
- Patent number 9,472,476
- Issue date Oct 18, 2016
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wang Jian Ping
- G01 - MEASURING TESTING
Information Patent Grant
System and method for test structure on a wafer
- Patent number 8,415,663
- Issue date Apr 9, 2013
- Semiconductor Manufacturing International (Shanghai)
- Wang Jian Ping
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR TEST STRUCTURE ON A WAFER
- Publication number 20130193997
- Publication date Aug 1, 2013
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wang Jian Ping
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TEST STRUCTURE ON A WAFER
- Publication number 20100164508
- Publication date Jul 1, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- WANG JIAN PING
- G01 - MEASURING TESTING