Wakana Shinke

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Hamura-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspecting method and apparatus for repeated micro-miniature patterns
- Patent number 6,944,325
- Issue date Sep 13, 2005
- Hitachi High-Tech Electronics Engineering Co., Ltd.
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting method and apparatus for repeated micro-miniature patterns
- Patent number 6,661,912
- Issue date Dec 9, 2003
- Hitachi Electronics Engineering Co., Ltd.
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Inspecting method and apparatus for repeated micro-miniature patterns
- Publication number 20040047500
- Publication date Mar 11, 2004
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING