Walter Baker MEINEL

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Infrared sensor design using an epoxy film as an infrared absorptio...
- Patent number 10,570,006
- Issue date Feb 25, 2020
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Infrared sensor design using an epoxy film as an infrared absorptio...
- Patent number 10,526,198
- Issue date Jan 7, 2020
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 9,921,110
- Issue date Mar 20, 2018
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor structure and method
- Patent number 9,417,133
- Issue date Aug 16, 2016
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 9,360,376
- Issue date Jun 7, 2016
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Reducing thermal gradients to improve thermopile performance
- Patent number 9,166,083
- Issue date Oct 20, 2015
- Texas Instruments Incorporated
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Etching cavity structures in silicon under dielectric membrane
- Patent number 9,157,807
- Issue date Oct 13, 2015
- Texas Instruments Incorporated
- Walter B. Meinel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Infrared light transmissivity for a membrane sensor
- Patent number 8,729,473
- Issue date May 20, 2014
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Cavity process etch undercut monitor
- Patent number 8,652,971
- Issue date Feb 18, 2014
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cavity open process to improve undercut
- Patent number 8,642,370
- Issue date Feb 4, 2014
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Heated air mass WCSP package and method for accelerometer
- Patent number 8,607,631
- Issue date Dec 17, 2013
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor structure and method
- Patent number 8,604,435
- Issue date Dec 10, 2013
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing thermopile variations
- Patent number 8,586,395
- Issue date Nov 19, 2013
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Ionic isolation ring
- Patent number 8,546,903
- Issue date Oct 1, 2013
- Texas Instruments Incorporated
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared light transmissivity for a membrane sensor
- Patent number 8,436,304
- Issue date May 7, 2013
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Vias in substrate between IC seat and peripheral thermal cage
- Patent number 8,411,442
- Issue date Apr 2, 2013
- Texas Instruments Incorporated
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated infrared sensors with optical elements, and methods
- Patent number 8,304,850
- Issue date Nov 6, 2012
- Texas Instruments Incorporated
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 8,129,682
- Issue date Mar 6, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,115,272
- Issue date Feb 14, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,114,779
- Issue date Feb 14, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,026,177
- Issue date Sep 27, 2011
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonlinear via arrays for resistors to reduce systematic circuit off...
- Patent number 7,449,783
- Issue date Nov 11, 2008
- Texas Instruments Incorporated
- Eric W. Beach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film resistor and dummy fill structure and method to improve s...
- Patent number 7,403,094
- Issue date Jul 22, 2008
- Texas Instruments Incorporated
- Eric W. Beach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for controlling surface properties of dielectr...
- Patent number 6,979,637
- Issue date Dec 27, 2005
- Texas Instruments Incorporated
- Eric W. Beach
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
CMOS comparator output stage and method
- Patent number 6,924,672
- Issue date Aug 2, 2005
- Texas Instruments Incorporated
- Vadim V. Ivanov
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Amplifier gain boost circuitry and method
- Patent number 6,828,856
- Issue date Dec 7, 2004
- Texas Instruments Incorporated
- Stephen J. Sanchez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Amplifier gain boost circuitry and method
- Patent number 6,825,721
- Issue date Nov 30, 2004
- Texas Instruments Incorporated
- Stephen J. Sanchez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and structure for controlling surface properties of dielectr...
- Patent number 6,818,966
- Issue date Nov 16, 2004
- Texas Instruments Incorporated
- Eric W. Beach
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
CMOS comparator output stage and method
- Patent number 6,819,148
- Issue date Nov 16, 2004
- Texas Instruments Incorporated
- Vadim V. Ivanov
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated photodiode/transimpedance amplifier
- Patent number 5,767,538
- Issue date Jun 16, 1998
- Burr-Brown Corporation
- Edward Mullins
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20170174505
- Publication date Jun 22, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20160282189
- Publication date Sep 29, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20150246810
- Publication date Sep 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20140151559
- Publication date Jun 5, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR STRUCTURE AND METHOD
- Publication number 20140131577
- Publication date May 15, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR
- Publication number 20130214159
- Publication date Aug 22, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE
- Publication number 20130175072
- Publication date Jul 11, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED AREA COVER PLATE FOR INTEGRATED INFRARED SENSOR
- Publication number 20130062720
- Publication date Mar 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Rick L. Wise
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS AND METHODS
- Publication number 20130043552
- Publication date Feb 21, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Application
Heated air mass WCSP package and method for accelerometer
- Publication number 20120266672
- Publication date Oct 25, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20120223400
- Publication date Sep 6, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CAVITY PROCESS ETCH UNDERCUT MONITOR
- Publication number 20120223401
- Publication date Sep 6, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CAVITY OPEN PROCESS TO IMPROVE UNDERCUT
- Publication number 20120225559
- Publication date Sep 6, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Infrared gesture recognition device and method
- Publication number 20120200486
- Publication date Aug 9, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20120138800
- Publication date Jun 7, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REDUCING THERMOPILE VARIATIONS
- Publication number 20120139077
- Publication date Jun 7, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
IONIC ISOLATION RING
- Publication number 20120086098
- Publication date Apr 12, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE
- Publication number 20120063093
- Publication date Mar 15, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR
- Publication number 20120061570
- Publication date Mar 15, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...
- Publication number 20110294246
- Publication date Dec 1, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...
- Publication number 20110291222
- Publication date Dec 1, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS, AND METHODS
- Publication number 20110147869
- Publication date Jun 23, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Application
Method and structures for etching cavity in silicon under dielectri...
- Publication number 20100327393
- Publication date Dec 30, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Silicon dioxide cantilever support and method for silicon etched st...
- Publication number 20100289108
- Publication date Nov 18, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
On-chip calibration system and method for infrared sensor
- Publication number 20100213374
- Publication date Aug 26, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
Infrared sensor structure and method
- Publication number 20100213373
- Publication date Aug 26, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
Structure and method for elimination of process-related defects in...
- Publication number 20090250784
- Publication date Oct 8, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonlinear via arrays for resistors to reduce systematic circuit off...
- Publication number 20060249793
- Publication date Nov 9, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Eric W. Beach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thin film resistor and dummy fill structure and method to improve s...
- Publication number 20060238292
- Publication date Oct 26, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Eric W. Beach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for controlling surface properties of dielectr...
- Publication number 20050186751
- Publication date Aug 25, 2005
- Eric W. Beach
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Walter Baker MEINEL

Person

Patents Grantslast 30 patents

Infrared sensor design using an epoxy film as an infrared absorptio...

Infrared sensor design using an epoxy film as an infrared absorptio...

On-chip calibration system and method for infrared sensor

Infrared sensor structure and method

On-chip calibration system and method for infrared sensor

Reducing thermal gradients to improve thermopile performance

Etching cavity structures in silicon under dielectric membrane

Infrared light transmissivity for a membrane sensor

Cavity process etch undercut monitor

Cavity open process to improve undercut

Heated air mass WCSP package and method for accelerometer

Infrared sensor structure and method

Method and apparatus for reducing thermopile variations

Ionic isolation ring

Infrared light transmissivity for a membrane sensor

Vias in substrate between IC seat and peripheral thermal cage

Integrated infrared sensors with optical elements, and methods

On-chip calibration system and method for infrared sensor

Silicon dioxide cantilever support and method for silicon etched st...

Silicon dioxide cantilever support and method for silicon etched st...

Silicon dioxide cantilever support and method for silicon etched st...

Nonlinear via arrays for resistors to reduce systematic circuit off...

Thin film resistor and dummy fill structure and method to improve s...

Method and structure for controlling surface properties of dielectr...

CMOS comparator output stage and method

Amplifier gain boost circuitry and method

Amplifier gain boost circuitry and method

Method and structure for controlling surface properties of dielectr...

CMOS comparator output stage and method

Integrated photodiode/transimpedance amplifier

Patents Applicationslast 30 patents

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

INFRARED SENSOR STRUCTURE AND METHOD

INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR

REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE

EXTENDED AREA COVER PLATE FOR INTEGRATED INFRARED SENSOR

INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS AND METHODS

Heated air mass WCSP package and method for accelerometer

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

CAVITY PROCESS ETCH UNDERCUT MONITOR

CAVITY OPEN PROCESS TO IMPROVE UNDERCUT

Infrared gesture recognition device and method

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

METHOD AND APPARATUS FOR REDUCING THERMOPILE VARIATIONS

IONIC ISOLATION RING

REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE

INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR

SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...

SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...

INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS, AND METHODS

Method and structures for etching cavity in silicon under dielectri...

Silicon dioxide cantilever support and method for silicon etched st...

On-chip calibration system and method for infrared sensor

Infrared sensor structure and method

Structure and method for elimination of process-related defects in...

Nonlinear via arrays for resistors to reduce systematic circuit off...

Thin film resistor and dummy fill structure and method to improve s...

Method and structure for controlling surface properties of dielectr...