Walter De Odorico

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Kelkheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for ultrasonic testing of a component
- Patent number 8,850,894
- Issue date Oct 7, 2014
- GE Sensing & Inspection Technologies GmbH
- Walter De Odorico
- G01 - MEASURING TESTING
Information Patent Grant
Planar probe head and ultrasonic testing device and method for a co...
- Patent number 8,650,959
- Issue date Feb 18, 2014
- GE Sensing & Inspection Technologies
- Walter Franz De Odorico
- G01 - MEASURING TESTING
Information Patent Grant
Method for the non-destructive testing of objects using ultrasound
- Patent number 8,596,127
- Issue date Dec 3, 2013
- GE Inspection Technologies
- Stephan Falter
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasound probe arrangement
- Patent number 7,798,003
- Issue date Sep 21, 2010
- GE Inspection Technologies, GmbH
- Albrecht Maurer
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit arrangement for disturbance-free examination of...
- Patent number 7,581,444
- Issue date Sep 1, 2009
- GE Inspection Technologies GmbH
- Albrecht Maurer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Planar Probe Head and Ultrasonic Testing Device and Method for a Co...
- Publication number 20110283799
- Publication date Nov 24, 2011
- Walter Franz De Odorico
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for the Non-Destructive Testing of Objects Using...
- Publication number 20110126626
- Publication date Jun 2, 2011
- Roman Heinrich Koch
- G01 - MEASURING TESTING
Information Patent Application
Ultrasound Probe Arrangement
- Publication number 20090126496
- Publication date May 21, 2009
- Albrecht Maurer
- G01 - MEASURING TESTING
Information Patent Application
Method and circuit arrangement for disturbance-free examination of...
- Publication number 20060195273
- Publication date Aug 31, 2006
- Albrecht Maurer
- G01 - MEASURING TESTING