Walter E. Gibson

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Real time observation serial scan test architecture
- Patent number 6,035,262
- Issue date Mar 7, 2000
- Tandem Computers Incorporated
- Walter E. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect testing using non-compatible scan architectures
- Patent number 6,029,263
- Issue date Feb 22, 2000
- Tandem Computers Incorporated
- Walter E. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing improved pseudo-random testing of...
- Patent number 5,951,703
- Issue date Sep 14, 1999
- Tandem Computers Incorporated
- Jeffrey A. Sprouse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault isolation using pseudo-random scan
- Patent number 5,694,401
- Issue date Dec 2, 1997
- Tandem Computers Incorporated
- Walter E. Gibson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for including the states of nonscannable parts...
- Patent number 5,450,455
- Issue date Sep 12, 1995
- Tandem Computers Incorporated
- Stephen W. Hamilton
- G01 - MEASURING TESTING