Walter H. Kuhl

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector
- Patent number 4,564,753
- Issue date Jan 14, 1986
- U.S. Philips Corporation
- Gerardus van Aller
- G01 - MEASURING TESTING
Information Patent Grant
X-Ray detector
- Patent number 4,418,452
- Issue date Dec 6, 1983
- U.S. Philips Corporation
- Walter H. Kuhl
- G01 - MEASURING TESTING