Walter M. Gibson

Person

Voorheesville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,343,193
- Issue date May 17, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,048,001
- Issue date Jun 2, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods for forming superconductor articles and XRD methods for cha...
- Patent number 8,647,705
- Issue date Feb 11, 2014
- Superpower, Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 8,559,597
- Issue date Oct 15, 2013
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Monochromatic x-ray micro beam for trace element mapping
- Patent number 7,991,116
- Issue date Aug 2, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for X-ray diffraction measurements using an align...
- Patent number 7,711,088
- Issue date May 4, 2010
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Portable and on-line arsenic analyzer for drinking water
- Patent number 7,298,817
- Issue date Nov 20, 2007
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
In-situ X-ray diffraction system using sources and detectors at fix...
- Patent number 7,236,566
- Issue date Jun 26, 2007
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for implement XANES analysis
- Patent number 7,206,375
- Issue date Apr 17, 2007
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Microcalorimeter x-ray detectors with x-ray lens
- Patent number 5,880,467
- Issue date Mar 9, 1999
- The United States of America as represented by the Secretary of Commerce
- John Matthew Martinis
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20160260514
- Publication date Sep 8, 2016
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20150262722
- Publication date Sep 17, 2015
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20140105363
- Publication date Apr 17, 2014
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR FORMING SUPERCONDUCTOR ARTICLES AND XRD METHODS FOR CHA...
- Publication number 20130150247
- Publication date Jun 13, 2013
- SuperPower. Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20110170666
- Publication date Jul 14, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING
- Publication number 20090161829
- Publication date Jun 25, 2009
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM
- Publication number 20080159479
- Publication date Jul 3, 2008
- X-Ray Optical Systems, Inc.
- Huapeng HUANG
- G01 - MEASURING TESTING
Information Patent Application
In-situ X-ray diffraction system using sources and detectors at fix...
- Publication number 20060140343
- Publication date Jun 29, 2006
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for implement XANES analysis
- Publication number 20060120508
- Publication date Jun 8, 2006
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
Portable and on-line arsenic analyzer for drinking water
- Publication number 20050157843
- Publication date Jul 21, 2005
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
Method and system for X-ray diffraction measurements using an align...
- Publication number 20050018809
- Publication date Jan 27, 2005
- X-Ray Optical Systems, Inc.
- David M. Gibson
- G01 - MEASURING TESTING
Information Patent Application
Methods for forming superconductor articles and XRD methods for cha...
- Publication number 20050014653
- Publication date Jan 20, 2005
- SuperPower, Inc.
- Jodi Lynn Reeves
- C30 - CRYSTAL GROWTH

Walter M. Gibson

Person

Patents Grantslast 30 patents

XRF system having multiple excitation energy bands in highly aligne...

XRF system having multiple excitation energy bands in highly aligne...

Methods for forming superconductor articles and XRD methods for cha...

XRF system having multiple excitation energy bands in highly aligne...

Monochromatic x-ray micro beam for trace element mapping

Method and system for X-ray diffraction measurements using an align...

Portable and on-line arsenic analyzer for drinking water

In-situ X-ray diffraction system using sources and detectors at fix...

Method and apparatus for implement XANES analysis

Microcalorimeter x-ray detectors with x-ray lens

Patents Applicationslast 30 patents

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

METHODS FOR FORMING SUPERCONDUCTOR ARTICLES AND XRD METHODS FOR CHA...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING

WIDE PARALLEL BEAM DIFFRACTION IMAGING METHOD AND SYSTEM

In-situ X-ray diffraction system using sources and detectors at fix...

Method and apparatus for implement XANES analysis

Portable and on-line arsenic analyzer for drinking water

Method and system for X-ray diffraction measurements using an align...

Methods for forming superconductor articles and XRD methods for cha...