Walter Nickel

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Walnut Creek, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of automatically calibrating a microprocessor controlled dig...
- Patent number 4,337,517
- Issue date Jun 29, 1982
- Systron Donner Corporation
- Walter Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Method of automatically calibrating a microprocessor controlled dig...
- Patent number 4,200,933
- Issue date Apr 29, 1980
- Systron Donner Corporation
- Walter Nickel
- G01 - MEASURING TESTING