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Walter Rutten
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Linnich/Ederen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Detector for and a method of detecting electromagnetic radiation
Patent number
8,193,501
Issue date
Jun 5, 2012
Koninklijke Philips Electronics N.V.
Walter Rutten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray detector
Patent number
7,521,683
Issue date
Apr 21, 2009
Koninklijke Philips Electronics N.V.
Walter Rütten
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
X-ray examination apparatus and radiation detector
Patent number
7,408,166
Issue date
Aug 5, 2008
Koninklijke Philips Electronics, N.V.
Dirk Schafer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
X-ray detector with photo-gates and dose control
Patent number
7,346,146
Issue date
Mar 18, 2008
Koninklijke Philips Electronic, N.V.
Walter Rütten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector for the temporally resolved recording of detection events
Patent number
7,301,151
Issue date
Nov 27, 2007
Koninklijke Philips Electronics N.V.
Walter Rütten
G01 - MEASURING TESTING
Information
Patent Grant
Imaging method and apparatus for imaging with low incident radiation
Patent number
6,947,086
Issue date
Sep 20, 2005
Koninklijke Philips Electronics, N.V.
Walter Rütten
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Sensor matrix
Patent number
6,894,283
Issue date
May 17, 2005
Koninklijke Philips Electronics, N.V.
Falko Busse
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
X-ray detector offering an improved light yield
Patent number
6,655,675
Issue date
Dec 2, 2003
Koninklijke Philips Electronics N.V.
Walter Rütten
G01 - MEASURING TESTING
Information
Patent Grant
Sensor and method of operating the sensor
Patent number
6,653,636
Issue date
Nov 25, 2003
Koninklijke Philips Electronics N.V.
Falko Busse
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
X-ray detector having sensors and evaluation units
Patent number
6,586,743
Issue date
Jul 1, 2003
Koninklijke Philips Electronics N.V.
Michael Overdick
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination apparatus with a semiconductor x-ray detector
Patent number
5,905,772
Issue date
May 18, 1999
U.S. Philips Corporation
Walter Rutten
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTOR FOR AND A METHOD OF DETECTING ELECTROMAGNETIC RADIATION
Publication number
20090321643
Publication date
Dec 31, 2009
Koninklijke Philips Electronics N.V.
Walter Rutten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-Ray Examination Apparatus and Radiation Detector
Publication number
20070272871
Publication date
Nov 29, 2007
Koninklijke Philips Electronics, N.V.
Dirk Schafer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method, a system for generating a spatial roadmap for an interventi...
Publication number
20070158572
Publication date
Jul 12, 2007
Koninklijke Philips Electronic, N.V.
Walter Rutten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detector for the temporally resolved recording of detection events
Publication number
20070090297
Publication date
Apr 26, 2007
Walter Rutten
G01 - MEASURING TESTING
Information
Patent Application
Circuit for addressing electronic units
Publication number
20070080916
Publication date
Apr 12, 2007
Augusto Nascetti
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
X-ray detector
Publication number
20070051894
Publication date
Mar 8, 2007
Koninklijke Philips Electronic, N.V.
Walter Rutten
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of reading out the sensor elements of a sensor, and a sensor
Publication number
20050218332
Publication date
Oct 6, 2005
Walter Rutten
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SENSOR AND METHOD OF OPERATING THE SENSOR
Publication number
20030146389
Publication date
Aug 7, 2003
Falko Busse
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
X-ray detector offering an improved light yield
Publication number
20020014592
Publication date
Feb 7, 2002
Walter Rutten
G01 - MEASURING TESTING