Walter S. Johnson

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflective compact lens for magneto-optic Kerr effect metrology system
- Patent number 12,164,093
- Issue date Dec 10, 2024
- Alex Zheng
- G02 - OPTICS
Information Patent Grant
Resistivity probes with curved portions
- Patent number 11,249,110
- Issue date Feb 15, 2022
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optic Kerr effect metrology systems
- Patent number 11,043,239
- Issue date Jun 22, 2021
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic determination of metal film thickness from sheet resistance...
- Patent number 10,663,279
- Issue date May 26, 2020
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic determination of metal film thickness from sheet resistance...
- Patent number 10,598,477
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Resistivity probe having movable needle bodies
- Patent number 10,514,391
- Issue date Dec 24, 2019
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Variable spacing four-point probe pin device and method
- Patent number 9,435,826
- Issue date Sep 6, 2016
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Variable pressure four-point coated probe pin device and method
- Patent number 9,030,219
- Issue date May 12, 2015
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Real-time location system using tag interrogator and embedded or fi...
- Patent number 7,916,026
- Issue date Mar 29, 2011
- Zebra Enterprise Solutions Corp.
- Walter S. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Precision frequency change detector
- Patent number 7,847,597
- Issue date Dec 7, 2010
- The Aerospace Corporation
- Yat C. Chan
- G01 - MEASURING TESTING
Information Patent Grant
Tag mounting device used for locating shipping containers and truck...
- Patent number 7,475,814
- Issue date Jan 13, 2009
- Wherenet Corp.
- Brett A. Wingo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Process and apparatus for integrating sheet resistance measurements...
- Patent number 7,050,160
- Issue date May 23, 2006
- KLA-Tencor Technologies Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring properties of conductive layers
- Patent number 6,815,959
- Issue date Nov 9, 2004
- KLA-Tencor Technologies Corp.
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
In-situ metalization monitoring using eddy current and optical meas...
- Patent number 6,707,540
- Issue date Mar 16, 2004
- KLA-Tencor Corporation
- Kurt R. Lehman
- G01 - MEASURING TESTING
Information Patent Grant
In-situ metalization monitoring using eddy current measurements dur...
- Patent number 6,621,264
- Issue date Sep 16, 2003
- KLA-Tencor Corporation
- Kurt R. Lehman
- G01 - MEASURING TESTING
Information Patent Grant
Elapsed time clock for part call tag-based replenishment system
- Patent number 6,502,005
- Issue date Dec 31, 2002
- Wherenet Corp.
- Mark A. Wrubel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-situ metalization monitoring using eddy current measurements dur...
- Patent number 6,433,541
- Issue date Aug 13, 2002
- KLA-Tencor Corporation
- Kurt R. Lehman
- G01 - MEASURING TESTING
Information Patent Grant
Wireless call tag based material replenishment system
- Patent number 6,317,082
- Issue date Nov 13, 2001
- Wherenet Corp
- Thomas M. Bacon
- G01 - MEASURING TESTING
Information Patent Grant
Infrared communication repeater architecture
- Patent number 5,563,728
- Issue date Oct 8, 1996
- Richard C. Allen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Eddy current test method and apparatus for measuring conductance by...
- Patent number 5,552,704
- Issue date Sep 3, 1996
- Tencor Instruments
- Chester L. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Infrared communication repeater architecture
- Patent number 5,384,652
- Issue date Jan 24, 1995
- Photonics Corporation
- Richard C. Allen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Cueing light configuration for aircraft navigation
- Patent number 5,315,296
- Issue date May 24, 1994
- The United States of America as represented by the administrator of the Natio...
- Mary K. Kaiser
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor surface resistivity probe with semiconductor temperat...
- Patent number 5,260,668
- Issue date Nov 9, 1993
- Prometrix Corporation
- Chester L. Mallory
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM
- Publication number 20220137380
- Publication date May 5, 2022
- KLA Corporation
- Alex ZHENG
- G02 - OPTICS
Information Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
- Publication number 20200302965
- Publication date Sep 24, 2020
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20200072869
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20180052189
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Determination of Metal Film Thickness from Sheet Resistance...
- Publication number 20170227347
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Determination of Metal Film Thickness from Sheet Resistance...
- Publication number 20170227348
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD
- Publication number 20130300445
- Publication date Nov 14, 2013
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE PRESSURE FOUR-POINT COATED PROBE PIN DEVICE AND METHOD
- Publication number 20130229196
- Publication date Sep 5, 2013
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Real-Time Location System Using Tag Interrogator and Embedded or Fi...
- Publication number 20110148589
- Publication date Jun 23, 2011
- Zebra Enterprise Solutions Corp.
- Walter S. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE ENTRY OR EXIT LANE OF VEHICLE...
- Publication number 20080129545
- Publication date Jun 5, 2008
- WHERENET CORP
- Walter S. JOHNSON
- G07 - CHECKING-DEVICES
Information Patent Application
REAL-TIME LOCATION SYSTEM USING TAG INTERROGATOR AND EMBEDDED OR FI...
- Publication number 20080111693
- Publication date May 15, 2008
- WHERENET CORP
- Walter S. JOHNSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA
- Publication number 20080042875
- Publication date Feb 21, 2008
- WHERENET CORP.
- Timothy C. Harrington
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA
- Publication number 20080042881
- Publication date Feb 21, 2008
- WHERENET CORP.
- Timothy C. Harrington
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA
- Publication number 20070290847
- Publication date Dec 20, 2007
- WHERENET CORP.
- Timothy C. Harrington
- G01 - MEASURING TESTING
Information Patent Application
Tag mounting device used for locating shipping containers and truck...
- Publication number 20070119927
- Publication date May 31, 2007
- WHERENET CORP
- Brett A. Wingo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
In-situ metalization monitoring using eddy current measurements dur...
- Publication number 20050194971
- Publication date Sep 8, 2005
- KLA-Tencor Corporation
- Kurt R. Lehman
- G01 - MEASURING TESTING
Information Patent Application
Vehicle tag used for transmitting vehicle telemetry data
- Publication number 20040249557
- Publication date Dec 9, 2004
- WHERENET CORP
- Timothy C. Harrington
- G01 - MEASURING TESTING
Information Patent Application
In-situ metalization monitoring using eddy current measurements dur...
- Publication number 20040189290
- Publication date Sep 30, 2004
- KLA-Tencor Corporation
- Kurt R. Lehman
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for measuring properties of conductive layers
- Publication number 20030060092
- Publication date Mar 27, 2003
- Walter H. Johnson
- G01 - MEASURING TESTING

Walter S. Johnson

Person

Patents Grantslast 30 patents

Reflective compact lens for magneto-optic Kerr effect metrology system

Resistivity probes with curved portions

Magneto-optic Kerr effect metrology systems

Dynamic determination of metal film thickness from sheet resistance...

Dynamic determination of metal film thickness from sheet resistance...

Resistivity probe having movable needle bodies

Variable spacing four-point probe pin device and method

Variable pressure four-point coated probe pin device and method

Real-time location system using tag interrogator and embedded or fi...

Precision frequency change detector

Tag mounting device used for locating shipping containers and truck...

Process and apparatus for integrating sheet resistance measurements...

Systems and methods for measuring properties of conductive layers

In-situ metalization monitoring using eddy current and optical meas...

In-situ metalization monitoring using eddy current measurements dur...

Elapsed time clock for part call tag-based replenishment system

In-situ metalization monitoring using eddy current measurements dur...

Wireless call tag based material replenishment system

Infrared communication repeater architecture

Eddy current test method and apparatus for measuring conductance by...

Infrared communication repeater architecture

Cueing light configuration for aircraft navigation

Semiconductor surface resistivity probe with semiconductor temperat...

Patents Applicationslast 30 patents

REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM

MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS

Multi-Pin Dense Array Resistivity Probe

Multi-Pin Dense Array Resistivity Probe

Dynamic Determination of Metal Film Thickness from Sheet Resistance...

Dynamic Determination of Metal Film Thickness from Sheet Resistance...

VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD

VARIABLE PRESSURE FOUR-POINT COATED PROBE PIN DEVICE AND METHOD

Real-Time Location System Using Tag Interrogator and Embedded or Fi...

SYSTEM AND METHOD FOR DETERMINING THE ENTRY OR EXIT LANE OF VEHICLE...

REAL-TIME LOCATION SYSTEM USING TAG INTERROGATOR AND EMBEDDED OR FI...

VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA

VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA

VEHICLE TAG USED FOR TRANSMITTING VEHICLE TELEMETRY DATA

Tag mounting device used for locating shipping containers and truck...

In-situ metalization monitoring using eddy current measurements dur...

Vehicle tag used for transmitting vehicle telemetry data

In-situ metalization monitoring using eddy current measurements dur...

Systems and methods for measuring properties of conductive layers